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ORCIDPaolo Bernardi 0002
Person information
- affiliation: Politecnico di Torino, Department of Control and Computer engineering, Turin, Italy
Other persons with the same name
- Paolo Bernardi — disambiguation page
- Paolo Bernardi 0001
![[0009-0000-6668-591X]](https://devdomain4test.ir/img/orcid-mark.12x12.png "0009-0000-6668-591X")
— University of Pisa, Department of Computer Science, Pisa, Italy
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2020 – today
- 2026
[j29]Gabriele Filipponi, Denis Schwachhofer, Francesco Angione, Claudia Bertani, Simone Corbellini, Nicola Di Gruttola Giardino, Giuseppe Garozzo, Giorgio Insinga, Vincenzo Tancorre, Paolo Bernardi:
Netlist-Independent Functional Stress Pattern Generation Strategy for AI HW Accelerators Embedded into SoCs. IEEE Trans. Computers 75(2): 554-566 (2026)- [j28]Paolo Bernardi, Giorgio Insinga, M. Battilana, P. Beer, Giambattista Carnevale, Matteo Coppetta, Nellina Mautone, Alberto Repele, Pierre Scaramuzza, Rudolf Ullmann:
A Versatile Strategy for Comprehensive Data Collection and Retention in Embedded SoC Memories. ACM Trans. Embed. Comput. Syst. 25(1): 6:1-6:15 (2026) - [c129]Simone Anedda, Paolo Bernardi, Matteo Coppetta, Giorgio Insinga, Tommaso Montedoro, Annachiara Ruospo, Rudolf Ullmann, Felix Tengler:
Off-Chip Super-Resolution AI Model to Support Embedded Memory Diagnosis. ETS 2026: 1-6 - [c128]Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Gabriele Filipponi, Giusy Iaria, Giacomo Perlo, Irith Pomeranz, Antonio Porsia, Annachiara Ruospo, Ernesto Sánchez, Vittorio Turco:
Advances in Testing and Reliability Benchmarks. ETS 2026: 1-10 - [c127]Paolo Bernardi, Lorenzo Cardone, Stefano Quer:
Fast Circuit Analysis via Neighborhood-Guided Maximum Common Subgraph. ETS 2026: 1-6 - [c126]Luca Benini, Paolo Bernardi, Alberto Bosio, Swarup Bhunia, Riccardo Cantoro, Degang Chen, Krishnendu Chakrabarty, Jayeeta Chaudhuri, Bastien Deveautour, Gabriele Filipponi, Angelo Garofalo, Salvatore Pappalardo, Sudipta Paria, Michael Rogenmoser, Philippe Sauter, Michael Sekyere, Chen Wu:
VTS2026 Contest Publication: TTTC's E.J. McCluskey Best Doctoral Thesis Award. VTS 2026: 1-18 - 2025
- [j27]Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Gabriele Filipponi, Claudia Bertani, Vincenzo Tancorre:
A System-Level Test Methodology for Communication Peripherals in System-on-Chips. IEEE Trans. Computers 74(2): 731-739 (2025) - [j26]Giusy Iaria, Paolo Bernardi, Claudia Bertani, Lorenzo Cardone, Giuseppe Garozzo, Vincenzo Tancorre:
A Comprehensive Scan Test Cost Model to Optimize the Production of Very Large SoCs. IEEE Trans. Computers 74(4): 1278-1292 (2025) - [j25]Francesco Angione, Paolo Bernardi, Giusy Iaria, Claudia Bertani, Vincenzo Tancorre:
Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC. IEEE Trans. Computers 74(9): 3195-3209 (2025) - [j24]Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, Stefano Quer, Claudia Bertani, Vincenzo Tancorre:
A Novel Indirect Methodology Based on Execution Traces for Grading Functional Test Programs. IEEE Trans. Computers 74(11): 3582-3595 (2025) - [c125]Paolo Bernardi, B. Borio, Giorgio Insinga, B. Mendicino, M. Battilana, Matteo Coppetta, N. Mautone, Pierre Scaramuzza, Felix Tengler, Rudolf Ullmann:
Late Breaking Results: A Data Compaction Strategy for Extensive Test Flows of Memories Embedded in Automotive SoCs. DATE 2025: 1-2 - [c124]Nicola Di Gruttola Giardino, Paolo Bernardi, Sabrina Corpino, Fabrizio Stesina:
HW/SW Co-Design of a Reliable Deep Space System Exploiting Application-Profiled RAM Scrubbing. DFT 2025: 1-6 - [c123]Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilárd Enyedi, Iulia Stefan, Ovidiu Stan, Cosmina Corches, Zebo Peng, Petru Eles, Rolf Drechsler, S. Eggersglüß, Görschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Po-Yao Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, Stefano Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, Patrick Girard, Marcello Traiola, Arnaud Virazel, Fernando Fernandes dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letícia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, Fabian Luis Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, Anurup Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand:
European Test Symposium Teams: an Anniversary Snapshot. ETS 2025: 1-48 - [c122]Francesco Angione, Paolo Bernardi, Riccardo Cantoro:
System-Level Test techniques for Automotive SoCs. ITC 2025: 568-577 - [c121]Alessandro Ciullo, Stephan Eggersglüß, Daniel Tille, Andreas Glowatz, Giusy Iaria, Paolo Bernardi:
Exploiting weak detections for optimizing pattern generation in Defect-Oriented Cell-Aware ATPG. ITC-Asia 2025: 72-77 - [c120]Francesco Angione, Paolo Bernardi, Claudia Bertani, Lorenzo Bertetto, Lorenzo Cardone, Nicola Di Gruttola Giardino, Stefano Quer, Vincenzo Tancorre:
Leveraging ATE to Optimize System-Level-Test for Multicore Automotive SoCs. LATS 2025: 1-6 - [c119]Paolo Bernardi, Gabriele Filipponi, Giusy Iaria, Claudia Bertani, Vincenzo Tancorre:
Enhancing Logic Diagnosis of Field Returns Through Logic BIST in Automotive SoCs. LATS 2025: 1-6 - [c118]Francesco Angione, Paolo Bernardi, Alberto Bosio, Harish Dattatraya Dixit, Salvatore Pappalardo, Annachiara Ruospo, Ernesto Sánchez, Arani Sinha, Vittorio Turco:
Special Session: Trustworthy Hardware-AI at the Cloud. VTS 2025: 1-11 - 2024
- [c117]Nicola Di Gruttola Giardino, Francesco Angione, Paolo Bernardi, Tommaso Foscale, Claudia Bertani, Vincenzo Tancorre:
A Flexible FPGA-Based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems. DFT 2024: 1-6 - [c116]Nima Kolahimahmoudi, Giorgio Insinga, Stefano Roggi, Josef Niederl, Paolo Bernardi:
A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements. DTTIS 2024: 1-6 - [c115]Denis Schwachhofer, Francesco Angione, Steffen Becker, Stefan Wagner, Matthias Sauer, Paolo Bernardi, Ilia Polian:
Optimizing System-Level Test Program Generation via Genetic Programming. ETS 2024: 1-4 - [c114]Paolo Bernardi, Lorenzo Cardone, Tommaso Foscale:
Exploring trade-offs in multi-site wafer testing. LATS 2024: 1-4 - 2023
- [j23]Francesco Angione, Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Quer, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli:
A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips. IEEE Access 11: 105655-105676 (2023) - [j22]Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli:
A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. IEEE Trans. Computers 72(5): 1447-1459 (2023) - [c113]Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Vincenzo Tancorre:
Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. DDECS 2023: 21-26 - [c112]Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre:
About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics. IOLTS 2023: 1-7 - [c111]Francesco Angione, Paolo Bernardi, Riccardo Cantoro, Nicola Di Gruttola Giardino, Davide Piumatti, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre:
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. LATS 2023: 1-6 - [c110]Paolo Bernardi, Gabriele Filipponi, Tommaso Foscale, Giorgio Insinga:
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests. LATS 2023: 1-2 - [c109]Paolo Bernardi, Giorgio Insinga, Nima Kolahimahmoudi:
A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test. VLSI-SoC 2023: 1-6 - [c108]Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre:
A guided debugger-based fault injection methodology for assessing functional test programs. VTS 2023: 1-7 - 2022
- [j21]Davide Appello, Paolo Bernardi, Andrea Calabrese, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli:
Parallel Multithread Analysis of Extremely Large Simulation Traces. IEEE Access 10: 56440-56457 (2022) - [c107]Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Claudia Tempesta, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli:
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. DFT 2022: 1-6 - [c106]Francesco Angione, Davide Appello, Joseph Aribido, Jyotika Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, Juan-David Guerrero-Balaguera, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Sánchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli:
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. ETS 2022: 1-10 - [c105]Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli:
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. ETS 2022: 1-6 - [c104]Paolo Bernardi, Giorgio Insinga, G. Paganini, Riccardo Cantoro, P. Beer, Matteo Coppetta, N. Mautone, G. Carnevale, Pierre Scaramuzza, Rudolf Ullmann:
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip. ETS 2022: 1-6 - [c103]Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu:
Recent Trends and Perspectives on Defect-Oriented Testing. IOLTS 2022: 1-10 - [c102]Vincent Huard, Francois Jacquet, Souhir Mhira, Lionel Jure, Olivier Montfort, Mathieu Louvat, L. Zaia, F. Bertrand, E. Acacia, O. Caffin, H. Belhadj, O. Durand, Nils Exibard, Vincent Bonnet, A. Charvier, Paolo Bernardi, Riccardo Cantoro:
Runtime Test Solution for Adaptive Aging Compensation and Fail Operational Safety mode. IRPS 2022: 8 - [c101]Giusy Iaria, Tommaso Foscale, Paolo Bernardi, Luca Presicce, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli:
A novel SEU injection setup for Automotive SoC. ISIE 2022: 623-626 - [c100]Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli:
An innovative Strategy to Quickly Grade Functional Test Programs. ITC 2022: 355-364 - [c99]Giusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre:
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. LATS 2022: 1-6 - 2021
- [c98]Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Littardi, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli:
Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. DDECS 2021: 69-74 - [c97]L. Degli Abbati, Rudolf Ullmann, G. Paganini, Matteo Coppetta, L. Zaia, Vincent Huard, Olivier Montfort, Riccardo Cantoro, Giorgio Insinga, F. Venini, P. Calao, Paolo Bernardi:
Industrial best practice: cases of study by automotive chip- makers. DFT 2021: 1-6 - [c96]Walter Ruggeri, Paolo Bernardi, Stefano Littardi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli:
Innovative methods for Burn-In related Stress Metrics Computation. DTIS 2021: 1-6 - [c95]Davide Appello, H. H. Chen, Matthias Sauer, Ilia Polian, Paolo Bernardi, Matteo Sonza Reorda:
System-Level Test: State of the Art and Challenges. IOLTS 2021: 1-7 - [i2]Ilia Polian, Jens Anders, Steffen Becker, Paolo Bernardi, Krishnendu Chakrabarty, Nourhan Elhamawy, Matthias Sauer, Adit D. Singh, Matteo Sonza Reorda, Stefan Wagner:
Exploring the Mysteries of System-Level Test. CoRR abs/2103.06656 (2021) - 2020
- [j20]Paolo Bernardi, Riccardo Cantoro, Sergio de Luca, Ernesto Sánchez, Alessandro Sansonetti, Giovanni Squillero:
Software-Based Self-Test Techniques for Dual-Issue Embedded Processors. IEEE Trans. Emerg. Top. Comput. 8(2): 464-477 (2020) - [c94]Ilia Polian, Jens Anders, Steffen Becker, Paolo Bernardi, Krishnendu Chakrabarty, Nourhan Elhamawy, Matthias Sauer, Adit D. Singh, Matteo Sonza Reorda, Stefan Wagner:
Exploring the Mysteries of System-Level Test. ATS 2020: 1-6 - [c93]Paolo Bernardi, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, D. Petrali:
Applicative System Level Test introduction to Increase Confidence on Screening Quality. DDECS 2020: 1-6
2010 – 2019
- 2019
- [c92]Paolo Bernardi, Riccardo Cantoro, Andrea Floridia, Davide Piumatti, C. Pogonea, Annachiara Ruospo, Ernesto Sánchez, Sergio de Luca, Alessandro Sansonetti:
Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions. DATE 2019: 920-923 - [c91]F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, Gulio Zoppi:
Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. DDECS 2019: 1-6 - [c90]Sara Carbonara, Paolo Bernardi, Marco Restifo:
A Hybrid In-Field Self-Test Technique for SoCs. DTIS 2019: 1-6 - [c89]A. Manzini, P. Inglese, L. Caldi, R. Cantero, G. Carnevale, Matteo Coppetta, M. Giltrelli, N. Mautone, F. Irrera, Rudolf Ullmann, Paolo Bernardi:
A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip. ETS 2019: 1-6 - [c88]Paolo Bernardi, Davide Piumatti, Ernesto Sánchez:
Facilitating Fault-Simulation Comprehension through a Fault-Lists Analysis Tool. LASCAS 2019: 77-80 - [c87]Alberto Bosio, Paolo Bernardi, Annachiara Ruospo, Ernesto Sánchez:
A Reliability Analysis of a Deep Neural Network. LATS 2019: 1-6 - 2018
- [j19]Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez, Federico Venini:
An Optimized Test During Burn-In for Automotive SoC. IEEE Des. Test 35(3): 46-53 (2018) - [j18]Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini:
Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. J. Electron. Test. 34(1): 43-52 (2018) - [j17]Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez, Federico Venini:
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. J. Low Power Electron. 14(1): 86-98 (2018) - [j16]Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda, Etienne Auvray:
Scan-Chain Intra-Cell Aware Testing. IEEE Trans. Emerg. Top. Comput. 6(2): 278-287 (2018) - 2017
- [j15]Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda:
Microprocessor Testing: Functional Meets Structural Test. J. Circuits Syst. Comput. 26(8): 1740007:1-1740007:18 (2017) - [c86]Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez, C. M. Villa, Federico Venini:
A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. DATE 2017: 646-649 - [c85]Marco Restifo, Paolo Bernardi, Sergio de Luca, Alessandro Sansonetti:
On-line software-based self-test for ECC of embedded RAM memories. DFT 2017: 1-6 - [c84]G. Harcha, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi:
An effective fault-injection framework for memory reliability enhancement perspectives. DTIS 2017: 1-6 - [c83]Paolo Bernardi, Marco Restifo, Ernesto Sánchez, Matteo Sonza Reorda:
On the in-field test of embedded memories. IOLTS 2017: 67-70 - [c82]Ulrich Backhausen, Oscar Ballan, Paolo Bernardi, Sergio de Luca, Julie Henzler, Thomas Kern, Davide Piumatti, Thomas Rabenalt, Krishnapriya Chakiat Ramamoorthy, Ernesto Sánchez, Alessandro Sansonetti, Rudolf Ullmann, Federico Venini, Robert Wiesner:
Robustness in automotive electronics: An industrial overview of major concerns. IOLTS 2017: 157-162 - [c81]Paolo Bernardi, Riccardo Cantoro, L. Gianotto, Marco Restifo, Ernesto Sánchez, Federico Venini, Davide Appello:
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller. LATS 2017: 1-6 - [c80]Paolo Bernardi, Sergio de Luca, Davide Piumatti, S. Regis, Ernesto Sánchez, Alessandro Sansonetti:
On the in-field testing of spare modules in automotive microprocessors. VLSI-SoC 2017: 1-6 - 2016
- [j14]Paolo Bernardi, Riccardo Cantoro, Sergio de Luca, Ernesto Sánchez, Alessandro Sansonetti:
Development Flow for On-Line Core Self-Test of Automotive Microcontrollers. IEEE Trans. Computers 65(3): 744-754 (2016) - [c79]Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda:
An effective approach for functional test programs compaction. DDECS 2016: 119-124 - [c78]Riccardo Cantoro, Davide Piumatti, Paolo Bernardi, Sergio de Luca, Alessandro Sansonetti:
In-field functional test programs development flow for embedded FPUs. DFT 2016: 107-110 - [c77]Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda:
Improving the Functional Test Delay Fault Coverage: A Microprocessor Case Study. ISVLSI 2016: 731-736 - [c76]Paolo Bernardi, Alberto Bosio, Giorgio Di Natale, Andrea Guerriero, Federico Venini:
Faster-than-at-speed execution of functional programs: An experimental analysis. VLSI-SoC 2016: 1-6 - [c75]Paolo Bernardi, Alberto Bosio, Giorgio Di Natale, Andrea Guerriero, Ernesto Sánchez, Federico Venini:
Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs. VLSI-SoC (Selected Papers) 2016: 130-151 - [c74]Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser:
Thermal issues in test: An overview of the significant aspects and industrial practice. VTS 2016: 1-4 - 2015
- [c73]Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda:
Exploring the impact of functional test programs re-used for power-aware testing. DATE 2015: 1277-1280 - [c72]Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda:
An effective ATPG flow for Gate Delay Faults. DTIS 2015: 1-6 - [c71]Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda:
Scan-chain intra-cell defects grading. DTIS 2015: 1-6 - [c70]Paolo Bernardi, C. Bovi, Riccardo Cantoro, Sergio de Luca, Renato Meregalli, Davide Piumatti, Ernesto Sánchez, Alessandro Sansonetti:
Software-based self-test techniques of computational modules in dual issue embedded processors. ETS 2015: 1-2 - [c69]Paolo Bernardi, Lyl M. Ciganda Brasca, Matteo Sonza Reorda, Said Hamdioui:
SW-based transparent in-field memory testing. LATS 2015: 1-6 - 2014
- [j13]Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan:
Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test. J. Electron. Test. 30(3): 317-328 (2014) - [j12]Paolo Bernardi, Lyl Mercedes Ciganda, Ernesto Sánchez, Matteo Sonza Reorda:
MIHST: A Hardware Technique for Embedded Microprocessor Functional On-Line Self-Test. IEEE Trans. Computers 63(11): 2760-2771 (2014) - [c68]Andreas Riefert, Lyl M. Ciganda, Matthias Sauer, Paolo Bernardi, Matteo Sonza Reorda, Bernd Becker:
An effective approach to automatic functional processor test generation for small-delay faults. DATE 2014: 1-6 - [c67]Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, S. Bernabovi, Paolo Bernardi:
An intra-cell defect grading tool. DDECS 2014: 298-301 - [c66]Paolo Bernardi, Riccardo Cantoro, Lyl M. Ciganda Brasca, Ernesto Sánchez, Matteo Sonza Reorda, Sergio de Luca, Renato Meregalli, Alessandro Sansonetti:
On the in-field functional testing of decode units in pipelined RISC processors. DFT 2014: 299-304 - [c65]Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, Paolo Bernardi:
A Comprehensive Evaluation of Functional Programs for Power-Aware Test. NATW 2014: 69-72 - 2013
- [j11]Paolo Bernardi, Mauricio de Carvalho, Ernesto Sánchez, Matteo Sonza Reorda, Alberto Bosio, Luigi Dilillo, Miroslav Valka, Patrick Girard:
Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption. J. Low Power Electron. 9(2): 253-263 (2013) - [c64]Paolo Bernardi, Lyl M. Ciganda, Matteo Sonza Reorda, Said Hamdioui:
An Efficient Method for the Test of Embedded Memory Cores during the Operational Phase. Asian Test Symposium 2013: 227-232 - [c63]Paolo Bernardi, Michele Bonazza, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan:
On-line functionally untestable fault identification in embedded processor cores. DATE 2013: 1462-1467 - [c62]Paolo Bernardi, D. Boyang, Lyl M. Ciganda, Ernesto Sánchez, Matteo Sonza Reorda, Michelangelo Grosso, Oscar Ballan:
A functional test algorithm for the register forwarding and pipeline interlocking unit in pipelined microprocessors. IDT 2013: 1-6 - [c61]Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan:
Increasing fault coverage during functional test in the operational phase. IOLTS 2013: 43-48 - [c60]Oscar Ballan, Paolo Bernardi, B. Yazdani, Ernesto Sánchez:
A software-based self-test strategy for on-line testing of the scan chain circuitries in embedded microprocessors. IOLTS 2013: 79-84 - [c59]Paolo Bernardi, Riccardo Cantoro, Lyl M. Ciganda Brasca, Boyang Du, Ernesto Sánchez, Matteo Sonza Reorda, Michelangelo Grosso, Oscar Ballan:
On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors. MTV 2013: 52-57 - 2012
- [j10]Paolo Bernardi, Lyl M. Ciganda:
An Adaptive Low-Cost Tester Architecture Supporting Embedded Memory Volume Diagnosis. IEEE Trans. Instrum. Meas. 61(4): 1002-1018 (2012) - [c58]Paolo Bernardi, Mauricio de Carvalho, Ernesto Sánchez, Matteo Sonza Reorda, Alberto Bosio, Luigi Dilillo, Patrick Girard, Miroslav Valka:
Peak Power Estimation: A Case Study on CPU Cores. Asian Test Symposium 2012: 167-172 - [c57]Paolo Bernardi, Lyl M. Ciganda, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda:
A SBST strategy to test microprocessors' Branch Target Buffer. DDECS 2012: 306-311 - [c56]Paolo Bernardi, Lyl M. Ciganda, Mauricio de Carvalho, Michelangelo Grosso, Jorge Luis Lagos-Benites, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan:
On-line software-based self-test of the Address Calculation Unit in RISC processors. ETS 2012: 1-6 - 2011
- [j9]Lyl M. Ciganda Brasca, Paolo Bernardi, Matteo Sonza Reorda, Dimitri Barbieri, Luciano Bonaria, Roberto Losco, Luciano Marcigot, Maurizio Straiotto:
A Parallel Tester Architecture for Accelerometer and Gyroscope MEMS Calibration and Test. J. Electron. Test. 27(3): 389-402 (2011) - [c55]Paolo Bernardi, Matteo Sonza Reorda:
A New Architecture to Cross-Fertilize On-Line and Manufacturing Testing. Asian Test Symposium 2011: 142-147 - [c54]Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Oscar Ballan:
Fault grading of software-based self-test procedures for dependable automotive applications. DATE 2011: 513-514 - [c53]Mauricio de Carvalho, Paolo Bernardi, Matteo Sonza Reorda, Nicola Campanelli, Tamas Kerekes, Davide Appello, Mario Barone, Vincenzo Tancorre, Marco Terzi:
Optimized embedded memory diagnosis. DDECS 2011: 347-352 - [c52]Paolo Bernardi, Matteo Sonza Reorda, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch:
On the Modeling of Gate Delay Faults by Means of Transition Delay Faults. DFT 2011: 226-232 - [c51]Paolo Bernardi, Lyl M. Ciganda, Ernesto Sánchez, Matteo Sonza Reorda:
An effective methodology for on-line testing of embedded microprocessors. IOLTS 2011: 270-275 - 2010
- [j8]Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda:
Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug. IET Comput. Digit. Tech. 4(2): 104-113 (2010) - [j7]Paolo Bernardi, Letícia Maria Veiras Bolzani Poehls, Michelangelo Grosso, Matteo Sonza Reorda:
A Hybrid Approach for Detection and Correction of Transient Faults in SoCs. IEEE Trans. Dependable Secur. Comput. 7(4): 439-445 (2010) - [c50]Nicola Campanelli, Tamas Kerekes, Paolo Bernardi, Mauricio de Carvalho, Alessandro Panariti, Matteo Sonza Reorda, Davide Appello, Mario Barone:
Cumulative embedded memory failure bitmap display & analysis. DDECS 2010: 255-260 - [c49]Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi, Matteo Sonza Reorda:
An Exact and Efficient Critical Path Tracing Algorithm. DELTA 2010: 164-169 - [c48]Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda:
An adaptive tester architecture for volume diagnosis. ETS 2010: 227-232 - [c47]Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Y. Zhang:
A programmable BIST for DRAM testing and diagnosis. ITC 2010: 447-456 - [c46]Lyl M. Ciganda Brasca, Paolo Bernardi, Matteo Sonza Reorda, Dimitri Barbieri, Maurizio Straiotto, Luciano Bonaria:
A tester architecture suitable for MEMS calibration and testing. ITC 2010: 806 - [c45]Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda:
An Enhanced Strategy for Functional Stress Pattern Generation for System-on-Chip Reliability Characterization. MTV 2010: 29-34 - [c44]Oscar Ballan, Paolo Bernardi, Giovanni Fontana, Michelangelo Grosso, Ernesto Sánchez:
A Fault Grading Methodology for Software-Based Self-Test Programs in Systems-on-Chip. MTV 2010: 43-46
2000 – 2009
- 2009
- [j6]Davide Appello, Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda:
Effective Diagnostic Pattern Generation Strategy for Transition-Delay Faults in Full-Scan SOCs. IEEE Trans. Very Large Scale Integr. Syst. 17(11): 1654-1659 (2009) - [c43]Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi, Matteo Sonza Reorda:
An efficient fault simulation technique for transition faults in non-scan sequential circuits. DDECS 2009: 50-55 - [c42]Lyl M. Ciganda, Francesco Abate, Paolo Bernardi, M. Bruno, Matteo Sonza Reorda:
An enhanced FPGA-based low-cost tester platform exploiting effective test data compression for SoCs. DDECS 2009: 258-263 - [c41]Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Sánchez, Matteo Sonza Reorda:
Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. ETS 2009: 93-98 - [c40]C. Guardiani, A. Shibkov, Angelo Brambilla, Giancarlo Storti Gajani, Davide Appello, Fausto Piazza, Paolo Bernardi:
An I-IP based approach for the monitoring of NBTI effects in SoCs. IOLTS 2009: 15-20 - [c39]Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello:
Evaluating Alpha-induced soft errors in embedded microprocessors. IOLTS 2009: 69-74 - [c38]Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda:
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. VTS 2009: 276-281 - 2008
- [j5]Paolo Bernardi, Ernesto Sánchez, Massimiliano Schillaci, Giovanni Squillero, Matteo Sonza Reorda:
An Effective Technique for the Automatic Generation of Diagnosis-Oriented Programs for Processor Cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(3): 570-574 (2008) - [c37]Paolo Bernardi, Matteo Sonza Reorda:
An novel Methodology for Reducing SoC Test Data Volume on FPGA-based Testers. DATE 2008: 194-199 - [c36]Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi:
SoC Symbolic Simulation: a case study on delay fault testing. DDECS 2008: 320-325 - [c35]Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso:
An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. ETS 2008: 140-145 - [c34]Paolo Bernardi, Kyriakos Christou, Michelangelo Grosso, Maria K. Michael, Ernesto Sánchez, Matteo Sonza Reorda:
Exploiting MOEA to Automatically Geneate Test Programs for Path-Delay Faults in Microprocessors. EvoWorkshops 2008: 224-234 - [c33]Paolo Bernardi, Fabio Melchiori, Davide Pandini, Santo Pugliese, Davide Appello:
Robust Design-for-Productization Practices for High Quality Automotive Products. ITC 2008: 1-9 - [c32]Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda:
A Deterministic Methodology for Identifying Functionally Untestable Path-Delay Faults in Microprocessor Cores. MTV 2008: 103-108 - [c31]Kyriakos Christou, Maria K. Michael, Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda:
A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions. VTS 2008: 389-394 - 2007
- [j4]Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda:
A System-layer Infrastructure for SoC Diagnosis. J. Electron. Test. 23(5): 389-404 (2007) - [c30]Paolo Bernardi, Claudio Demartini, Filippo Gandino, Bartolomeo Montrucchio, Maurizio Rebaudengo, Erwing Ricardo Sanchez:
Agri-Food Traceability Management using a RFID System with Privacy Protection. AINA 2007: 68-75 - [c29]Paolo Bernardi, Letícia Maria Veiras Bolzani, Matteo Sonza Reorda:
Extended Fault Detection Techniques for Systems-on-Chip. DDECS 2007: 55-60 - [c28]Jorge Luis Lagos-Benites, Davide Appello, Paolo Bernardi, Michelangelo Grosso, Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda:
An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains. DFT 2007: 291-300 - [c27]Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda:
On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores. ETS 2007: 179-184 - [c26]Paolo Bernardi, Filippo Gandino, Bartolomeo Montrucchio, Maurizio Rebaudengo, Erwing Ricardo Sanchez:
Design of an UHF RFID transponder for secure authentication. ACM Great Lakes Symposium on VLSI 2007: 387-392 - [c25]Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda:
Hardware-accelerated path-delay fault grading of functional test programs for processor-based systems. ACM Great Lakes Symposium on VLSI 2007: 411-416 - [c24]Paolo Bernardi, Letícia Maria Veiras Bolzani, Matteo Sonza Reorda:
A Hybrid Approach to Fault Detection and Correction in SoCs. IOLTS 2007: 107-112 - [c23]Letícia Maria Veiras Bolzani, Paolo Bernardi, Matteo Sonza Reorda:
An optimized hybrid approach to provide fault detection and correction in SoCs. SBCCI 2007: 342-347 - [i1]Paolo Bernardi, Guido Masera, Federico Quaglio, Matteo Sonza Reorda:
Testing Logic Cores using a BIST P1500 Compliant Approach: A Case of Study. CoRR abs/0710.4840 (2007) - 2006
- [b1]Paolo Bernardi:
Test techniques for systems-on-a-chip. Polytechnic University of Turin, Italy, 2006 - [j3]Davide Appello, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda:
System-in-Package Testing: Problems and Solutions. IEEE Des. Test Comput. 23(3): 203-211 (2006) - [j2]Paolo Bernardi, Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante:
A New Hybrid Fault Detection Technique for Systems-on-a-Chip. IEEE Trans. Computers 55(2): 185-198 (2006) - [c22]Paolo Bernardi, Ernesto Sánchez, Massimiliano Schillaci, Giovanni Squillero, Matteo Sonza Reorda:
An Evolutionary Methodology to Enhance Processor Software-Based Diagnosis. IEEE Congress on Evolutionary Computation 2006: 859-864 - [c21]Paolo Bernardi, Ernesto Sánchez, Massimiliano Schillaci, Giovanni Squillero, Matteo Sonza Reorda:
An effective technique for minimizing the cost of processor software-based diagnosis in SoCs. DATE 2006: 412-417 - [c20]Paolo Bernardi, Michelangelo Grosso:
Test Considerations about the Structured ASIC Paradigm. DDECS 2006: 232-233 - [c19]Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda:
Embedded Memory Diagnosis: An Industrial Workflow. ITC 2006: 1-9 - [c18]Paolo Bernardi, Letícia Maria Veiras Bolzani, Alberto Manzone, Massimo Osella, Massimo Violante, Matteo Sonza Reorda:
Software-Based On-Line Test of Communication Peripherals in Processor-Based Systems for Automotive Applications. MTV 2006: 3-8 - [c17]Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda:
On the Automation of the Test Flow of Complex SoCs. VTS 2006: 166-171 - [c16]Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda:
A Pattern Ordering Algorithm for Reducing the Size of Fault Dictionaries. VTS 2006: 386-391 - 2005
- [c15]Paolo Bernardi, Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante:
An Integrated Approach for Increasing the Soft-Error Detection Capabilities in SoCs processors. DFT 2005: 445-453 - [c14]Paolo Bernardi, Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante:
On-Line Detection of Control-Flow Errors in SoCs by Means of an Infrastructure IP Core. DSN 2005: 50-58 - [c13]Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda:
Exploiting an infrastructure IP to reduce memory diagnosis costs in SoCs. ETS 2005: 202-207 - [c12]Alberto Manzone, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Ernesto Sánchez, Matteo Sonza Reorda:
Integrating BIST Techniques for On-Line SoC Testing. IOLTS 2005: 235-240 - [c11]Paolo Bernardi, Ernesto Sánchez, Massimiliano Schillaci, Matteo Sonza Reorda, Giovanni Squillero:
Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets. MTV 2005: 37-41 - [c10]Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda:
Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores. MTV 2005: 55-62 - 2004
- [j1]Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Paolo Bernardi, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda:
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. J. Electron. Test. 20(1): 79-87 (2004) - [c9]Paolo Bernardi, Guido Masera, Federico Quaglio, Matteo Sonza Reorda:
Testing Logic Cores using a BIST P1500 Compliant Approach: A Case of Study. DATE 2004: 228-233 - [c8]M. Bellato, Paolo Bernardi, D. Bortolato, A. Candelori, M. Ceschia, Alessandro Paccagnella, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante, P. Zambolin:
Evaluating the Effects of SEUs Affecting the Configuration Memory of an SRAM-Based FPGA. DATE 2004: 584-589 - [c7]Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda:
Exploiting an I-IP for In-Field SOC Test. DFT 2004: 404-412 - [c6]Paolo Bernardi, Matteo Sonza Reorda, Luca Sterpone, Massimo Violante:
On the Evaluation of SEU Sensitiveness in SRAM-Based FPGAs. IOLTS 2004: 115-120 - [c5]Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda:
Using Infrastructure IPs to Support SW-Based Self-Test of Processor Cores. MTV 2004: 22-27 - 2003
- [c4]Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante:
A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories. DATE 2003: 10720-10725 - [c3]Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda:
An efficient algorithm for the extraction of compressed diagnostic information from embedded memory cores. ETFA (1) 2003: 417-421 - [c2]Massimo Violante, M. Ceschia, Matteo Sonza Reorda, Alessandro Paccagnella, Paolo Bernardi, Maurizio Rebaudengo, D. Bortolato, M. Bellato, P. Zambolin, A. Candelori:
Analyzing SEU Effects in SRAM-based FPGAs. IOLTS 2003: 119-123 - [c1]Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante:
Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. ITC 2003: 379-385
Coauthor Index
Letícia Maria Veiras Bolzani
aka: Letícia Maria Veiras Bolzani Poehls
aka: Letícia Maria Bolzani Poehls
aka: Letícia Maria Veiras Bolzani Poehls
aka: Letícia Maria Bolzani Poehls
[c123] [j23] [j22] [c113] [c111] [c107] [c106] [c105] [c103] [c101] [c99] [c96] [c95] [i2] [c94] [c93] [c91] [j16] [j15] [c83] [c79] [c77] [c73] [c72] [c71] [c69] [j13] [j12] [c68] [c66] [j11] [c64] [c63] [c62] [c61] [c59] [c58] [c57] [c56] [j9] [c55] [c53] [c52] [c51] [j8] [j7] [c50] [c49] [c48] [c47] [c46] [c45] [j6] [c43] [c42] [c41] [c39] [c38] [j5] [c37] [c34] [c32] [c31] [j4] [c29] [c28] [c27] [c25] [c24] [c23] [i1] [j3] [j2] [c22] [c21] [c19] [c18] [c17] [c16] [c15] [c14] [c13] [c12] [c11] [c10] [j1] [c9] [c8] [c7] [c6] [c5] [c4] [c3] [c2] [c1]
Ernesto Sánchez 0001
aka: Edgar E. Sánchez
aka: Edgar E. Sánchez
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