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ORCID23rd NATW 2014: Johnson City, NY, USA
- IEEE 23rd North Atlantic Test Workshop, NATW 2014, Johnson City, NY, USA, May 14-16, 2014. IEEE 2014
- Ramesh C. Tekumalla, Prakash Krishnamoorthy:
Local Repair Signature Handling for Repairable Memories. 1-5 - Surbhi Bansal, Aviansh Mendhalkar, Ramesh C. Tekumalla:
On Handling Memory Scan Chains. 6-10 - Ramesh C. Tekumalla, Prakash Krishnamoorthy:
On-chip Clock Testing and Frequency Measurement. 11-14 - Tommy Lam:
Innovative Antenna Chamber Characterization. 15-21 - Yu Huang, Mark Kassab, Jay Jahangiri, Janusz Rajski, Wu-Tung Cheng, Dongkwan Han, Jihye Kim, Kun Young Chung:
Test Compression Improvement with EDT Channel Sharing in SoC Designs. 22-31 - Fanchen Zhang, Micah Thornton, Jennifer Dworak:
When Optimized N-Detect Test Sets are Biased: An Investigation of Cell-Aware-Type Faults and N-Detect Stuck-At ATPG. 32-39 - Grace Tang:
Power System Fault Modeling/Simulation Protective Relay Testing and Simulation. 40-42 - Md. Tauhidur Rahman
, Domenic Forte, Quihang Shi, Gustavo K. Contreras, Mohammad Tehranipoor:
CSST: An Efficient Secure Split-Test for Preventing IC Piracy. 43-47 - Pascal Nsame, Guy Bois, Yvon Savaria:
Design and Test of Adaptive Computing Fabrics for Scalable and High-Efficiency Cognitive SoC Applications. 48-51 - Sindhu Gunasekar, Vishwani D. Agrawal:
Optimal Selection of ATE Frequencies for Test Time Reduction Using Aperiodic Clock. 52-56 - Muralidharan Venkatasubramanian, Vishwani D. Agrawal:
A New Test Vector Search Algorithm for a Single Stuck-at Fault Using Probabilistic Correlation. 57-60 - Tengteng Zhang, Yukun Gao, D. M. H. Walker:
Pattern Generation for Post-Silicon Timing Validation Considering Power Supply Noise. 61-64 - Yukun Gao, Tengteng Zhang, Swati Chakraborty, D. M. H. Walker:
Delay Test of Embedded Memories. 65-68 - Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, Paolo Bernardi:
A Comprehensive Evaluation of Functional Programs for Power-Aware Test. 69-72 - Konstantin Shibin, Sergei Devadze, Artur Jutman:
Asynchronous Fault Detection in IEEE P1687 Instrument Network. 73-78
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