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ORCID25th IOLTS 2019: Rhodes, Greece
- Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos:
25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, July 1-3, 2019. IEEE 2019, ISBN 978-1-7281-2490-2 - Mitsunori Ebara, Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi:
Comparison of Radiation Hardness of Stacked Transmission-Gate Flip Flop and Stacked Tristate-Inverter Flip Flop in a 65 nm Thin BOX FDSOI Process. 1-6 - Thomas Lange, Aneesh Balakrishnan
, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone:
Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits. 7-14 - Anselm Breitenreiter, Stefan Weidling, Oliver Schrape, Steffen Zeidler, Pedro Reviriego, Milos Krstic:
Selective Fault Tolerance by Counting Gates with Controlling Value. 15-20 - Safa Mhamdi, Arnaud Virazel, Patrick Girard, Alberto Bosio, Etienne Auvray, Eric Faehn, Aymen Ladhar:
Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip. 21-26 - Constantinos Xanthopoulos, Arnold Neckermann, Paulus List, Klaus-Peter Tschernay, Peter Sarson, Yiorgos Makris:
Automated Die Inking through On-line Machine Learning. 27-32 - Manuel Escudero, Ioannis Vourkas, Antonio Rubio:
Stuck-at-OFF Fault Analysis in Memristor-Based Architecture for Synchronization. 33-37 - Jyotika Athavale, Riccardo Mariani, Michael Paulitsch:
Flight Safety Certification Implications for Complex Multi-Core Processor based Avionics Systems. 38-39 - Yuta Ishiyama, Toshinori Hosokawa, Hiroshi Yamazaki:
A Design for Testability Method for k-Cycle Capture Test Generation. 40-43 - Yusuke Matsunaga, Masayoshi Yoshimura:
An Efficient SAT-Attack Algorithm Against Logic Encryption. 44-47 - Yukiya Miura, Miyuki Inoue, Yuya Kinoshita:
Development of FF Circuits for Measures Against Power Supply Noise. 48-51 - Ahmet Cagri Bagbaba, Maksim Jenihhin, Jaan Raik, Christian Sauer:
Efficient Fault Injection based on Dynamic HDL Slicing Technique. 52-53 - Kento Hasegawa, Kiyoshi Chikamatsu, Nozomu Togawa:
Empirical Evaluation on Anomaly Behavior Detection for Low-Cost Micro-Controllers Utilizing Accurate Power Analysis. 54-57 - Saurabh Khandelwal, Anu Bala, Vishal Gupta, Marco Ottavi, Eugenio Martinelli, Abusaleh M. Jabir:
Fault Modeling and Simulation of Memristor based Gas Sensors. 58-59 - Daniel J. Weyer, Francis G. Wolff, Christos A. Papachristou, Steve Clay:
Methodology for Tradeoffs between Performance and Lifetimes of Integrated Circuits. 60-63 - Sajjad Parvin, Mustafa Altun:
Implementation of CMOS Logic Circuits with Perfect Fault Detection Using Preservative Reversible Gates. 64-67 - Hussam Amrouch, Victor M. van Santen, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann, Jörg Henkel:
Reliability Challenges with Self-Heating and Aging in FinFET Technology. 68-71 - Audrey Michard, Florian Cacho, Damien Celeste, Xavier Federspiel:
Global and Local Process Variation Simulations in Design for Reliability approach. 72-75 - Edoardo Ceccarelli, Kevin Manning, Giuseppe Macera, Dennis Dempsey, Colm Heffernan:
HCD-Induced GIDL Increase and Circuit Implications. 76-79 - Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Hayk T. Grigoryan, Grigor Tshagharyan:
Variation-aware Fault Modeling and Test Generation for STT-MRAM. 80-83 - Eduardo Nunes de Souza, Gabriel L. Nazar:
Cost-effective Resilient FPGA-based LDPC Decoder Architecture. 84-89 - Sergi Alcaide, Leonidas Kosmidis, Carles Hernández, Jaume Abella:
Software-only Diverse Redundancy on GPUs for Autonomous Driving Platforms. 90-96 - Josie E. Rodriguez Condia, Matteo Sonza Reorda:
Testing permanent faults in pipeline registers of GPGPUs: A multi-kernel approach. 97-102 - Ehsan Aerabi, Athanasios Papadimitriou, David Hély:
On a Side Channel and Fault Attack Concurrent Countermeasure Methodology for MCU-based Byte-sliced Cipher Implementations. 103-108 - Cristiana Bolchini, Luca Cassano, Ivan Montalbano, Giampiero Repole, Andrea Zanetti, Giorgio Di Natale:
HATE: a HArdware Trojan Emulation Environment for Microprocessor-based Systems. 109-114 - Elena-Ioana Vatajelu, Giorgio Di Natale, Mohd Syafiq Mispan, Basel Halak:
On the Encryption of the Challenge in Physically Unclonable Functions. 115-120 - Andrew Richardson, David Cheneler:
Self-Monitoring, Self-Healing Biomorphic Sensor Technology. 121-124 - Kiruba S. Subramani, Georgios Volanis, Mohammad-Mahdi Bidmeshki, Angelos Antonopoulos, Yiorgos Makris:
Trusted and Secure Design of Analog/RF ICs: Recent Developments. 125-128 - Dimitris Gizopoulos, George Papadimitriou, Athanasios Chatzidimitriou, Vijay Janapa Reddi, Behzad Salami, Osman S. Unsal, Adrián Cristal Kestelman, Jingwen Leng:
Modern Hardware Margins: CPUs, GPUs, FPGAs Recent System-Level Studies. 129-134 - Jacob A. Abraham:
Resiliency Demands on Next Generation Critical Embedded Systems. 135-138 - Florian Kriebel, Semeen Rehman, Muhammad Shafique:
Studying Aging and Soft Error Mitigation Jointly under Constrained Scenarios in Multi-Cores. 139-142 - Alessandro Vallero, Alessandro Savino, Alberto Carelli, Stefano Di Carlo:
Bayesian models for early cross-layer reliability analysis and design space exploration. 143-146 - Johann Knechtel, Satwik Patnaik, Ozgur Sinanoglu:
3D Integration: Another Dimension Toward Hardware Security. 147-150 - Mohammed Shayan, Sukanta Bhattacharjee, Yong-Ak Song, Krishnendu Chakrabarty, Ramesh Karri:
Can Multi-Layer Microfluidic Design Methods Aid Bio-Intellectual Property Protection? 151-154 - Prashant Hari Narayan Rajput, Michail Maniatakos:
JTAG: A Multifaceted Tool for Cyber Security. 155-158 - Marco Ottavi, Vishal Gupta, Saurabh Khandelwal, Shahar Kvatinsky, Jimson Mathew, Eugenio Martinelli, Abusaleh M. Jabir:
The Missing Applications Found: Robust Design Techniques and Novel Uses of Memristors. 159-164 - Jiaqiang Li, Pedro Reviriego, Costas Argyrides, Liyi Xiao:
Efficient Concurrent Error Detection for SEC-DAEC Encoders. 165-170 - Paul-Patrick Nordmann, Michael Gössel:
A New DEC/TED Code for Fast Correction of 2-Bit-Errors. 171-175 - Luc Jaulmes, Miquel Moretó, Mateo Valero, Marc Casas:
A Vulnerability Factor for ECC-protected Memory. 176-181 - Faiq Khalid, Hassan Ali, Hammad Tariq, Muhammad Abdullah Hanif, Semeen Rehman, Rehan Ahmed, Muhammad Shafique:
QuSecNets: Quantization-based Defense Mechanism for Securing Deep Neural Network against Adversarial Attacks. 182-187 - Faiq Khalid, Muhammad Abdullah Hanif, Semeen Rehman, Rehan Ahmed, Muhammad Shafique:
TrISec: Training Data-Unaware Imperceptible Security Attacks on Deep Neural Networks. 188-193 - Dimitrios Tychalas, Anastasis Keliris, Michail Maniatakos:
LED Alert: Supply Chain Threats for Stealthy Data Exfiltration in Industrial Control Systems. 194-199 - Andreas Kouloumpris, Maria K. Michael, Theocharis Theocharides:
Reliability-Aware Task Allocation Latency Optimization in Edge Computing. 200-203 - Vijeta Rathore, Vivek Chaturvedi, Amit Kumar Singh, Thambipillai Srikanthan, Muhammad Shafique:
Towards Scalable Lifetime Reliability Management for Dark Silicon Manycore Systems. 204-207 - Philipp H. Kindt, Samarjit Chakraborty:
Power-aware Reliable Communication for the IoT. 208-211 - Marko S. Andjelkovic, Yuanqing Li, Zoran Stamenkovic, Milos Krstic, Rolf Kraemer:
Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells. 212-215 - Cristiano Calligaro, Umberto Gatti:
Recipes to build-up a rad-hard CMOS memory. 216-219 - Anselm Breitenreiter, Jesús López, Pedro Reviriego, Milos Krstic, Úrsula Gutierro, Manuel Sánchez-Renedo, Daniel González:
A Radiation Tolerant 10/100 Ethernet Transceiver for Space Applications. 220-223 - Karthikeyan Nagarajan, Mohammad Nasim Imtiaz Khan, Sina Sayyah Ensan, Abdullah Ash-Saki, Swaroop Ghosh:
Meeting the Conflicting Goals of Low-Power and Resiliency Using Emerging Memories : (Invited Paper). 224-227 - Bing-Chen Wu, Tsung-Te Liu:
Variation-Resilient Design Techniques for Energy-Constrained Systems. 228-231 - Yuya Kinoshita, Toshinori Hosokawa, Hideo Fujiwara:
A Test Generation Method Based on k-Cycle Testing for Finite State Machines. 232-235 - Takashi Yoshida, Kazutoshi Kobayashi, Jun Furuta:
Total Ionizing Dose Effects by alpha irradiation on circuit performance and SEU tolerance in thin BOX FDSOI process. 236-238 - Xinhui Lai, Maksim Jenihhin, Jaan Raik, Kolin Paul:
PASCAL: Timing SCA Resistant Design and Verification Flow. 239-242 - Ryota Ishikawa, Masashi Tawada, Masao Yanagisawa, Nozomu Togawa:
Error Correction Coding of Stochastic Numbers Using BER Measurement. 243-246 - Ghislain Takam Tchendjou, Emmanuel Simeu:
Control Loop of Image Correction based on Detection and Self-Healing of Defective Pixels. 247-250 - Satyadev Ahlawat, Kailash Ahirwar, Jaynarayan T. Tudu, Masahiro Fujita, Virendra Singh:
Securing Scan through Plain-text Restriction. 251-252 - Jacopo Sini, Massimo Violante, V. Dodde, R. Gnaniah, L. Pecorella:
A Novel Simulation-Based Approach for ISO 26262 Hazard Analysis and Risk Assessment. 253-254 - Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer:
Efficient Methodology for ISO26262 Functional Safety Verification. 255-256 - Shu-Han Hsu, Ying-Yuan Huang, Kexin Yang, Linda Milor:
Identification of Failure Modes for Circuit Samples with Confounded Causes of Failure. 257-262 - Kai-Chiang Wu, Wei-Tao Huang, Chiao-Yang Huang:
ICE-RADAR: In-situ, Cost-Effective Razor Flip-Flop Deployment for Aging Resilience. 263-268 - Chiara Sandionigi, Olivier Héron:
Estimation of oxide breakdown effects by fault injection. 269-274 - Vasileios Tenentes, Shidhartha Das, Daniele Rossi, Bashir M. Al-Hashimi:
Run-time Detection and Mitigation of Power-Noise Viruses. 275-280 - Abdessamad Najdi, Daniele Rossi, Vasileios Tenentes:
Analysis on Retention Time and Adaptive Refresh in Embedded DRAMs with Aging Benefits. 281-286 - Kuozhong Zhang, Junying Huang, Jing Ye, Xiaochun Ye, Da Wang, Dongrui Fan, Huawei Li, Xiaowei Li, Zhimin Zhang:
iATPG: Instruction-level Automatic Test Program Generation for Vulnerabilities under DVFS attack. 287-292 - Yuki Takeuchi, Toshinori Hosokawa, Hiroshi Yamazaki, Masayoshi Yoshimura:
A Controller Augmentation Method to Improve Transition Fault Coverage for RTL Data-Paths. 293-298 - Lembit Jürimägi, Raimund Ubar, Maksim Jenihhin, Jaan Raik, Sergei Devadze, Adeboye Stephen Oyeniran:
Application Specific True Critical Paths Identification in Sequential Circuits. 299-304 - Takumi Hosaka, Shinichi Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi:
Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement. 305-309 - Lucas Klein Draghetti, Fernando Fernandes dos Santos, Luigi Carro, Paolo Rech:
Detecting Errors in Convolutional Neural Networks Using Inter Frame Spatio-Temporal Correlation. 310-315 - Md Imran Momtaz, Abhijit Chatterjee:
Hierarchical Check Based Detection and Diagnosis of Sensor-Actuator Malfunction in Autonomous Systems: A Quadcopter Study. 316-321 - Mounia Kharbouche-Harrari, Romain Wacquez, Gregory di Pendina, Jean-Max Dutertre, Jérémy Postel-Pellerin, Driss Aboulkassimi, Jean-Michel Portal:
Dual Detection of Heating and Photocurrent attacks (DDHP) Sensor using Hybrid CMOS/STT-MRAM. 322-327
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