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"Characterization and Modeling of SET Generation Effects in CMOS Standard ..."
Marko S. Andjelkovic et al. (2019)
- Marko S. Andjelkovic

, Yuanqing Li, Zoran Stamenkovic
, Milos Krstic
, Rolf Kraemer:
Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells. IOLTS 2019: 212-215

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