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"A Test Generation Method Based on k-Cycle Testing for Finite State Machines."
Yuya Kinoshita, Toshinori Hosokawa, Hideo Fujiwara (2019)
- Yuya Kinoshita, Toshinori Hosokawa, Hideo Fujiwara:

A Test Generation Method Based on k-Cycle Testing for Finite State Machines. IOLTS 2019: 232-235

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