"Variability and Analog Parameter Characterization in Enclosed Layout ..."

Gustavo Paz Platcheck, Guilherme Schwanke Cardoso, Tiago R. Balen (2025)

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DOI: 10.1007/S10836-025-06199-X

access: closed

type: Journal Article

metadata version: 2026-02-01

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Gustavo Paz Platcheck, Guilherme Schwanke Cardoso, Tiago R. Balen:
Variability and Analog Parameter Characterization in Enclosed Layout Transistors. J. Electron. Test. 41(5): 805-821 (2025)

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