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ORCIDJournal of Electronic Testing, Volume 41
Volume 41, Number 1, February 2025
- Vishwani D. Agrawal:
Editorial. 1 - 2024 Reviewers. 3-4
- Arjun Lal Kumawat
, Anukul Pandey, N. S. Raghava:
Design of a Low Noise Amplifier Based on Novel Monolayer Graphene FET. 5-14 - Vipin Kumar Sharma, Abhishek Kumar:
Read & Write Stability of CNTFET 6T SRAM Cell: A Comprehensive Analysis. 15-25 - Jie Fu, Kai Sun, Hanbo Jia, Da Fu, Jingyuan Xu, Xuan Guo:
Quantity Analysis Method for Text-Based Chip Test Datasets from Automated Test Equipment. 27-39 - Shounak Rushikesh Sugave, Yogesh R. Kulkarni, Balaso Jagdale, Vitthal Gutte:
Fault-Aware Test Case Prioritization in Software Testing Using Jaya Archimedes Optimization Algorithm. 41-61 - Hamed A. Mahmood, Shawkat Sabah Khairullah:
Design and Simulation of a Dependable Architecture Using Triple Modular Redundancy for Embedded Cyber-Physical Systems. 63-74 - Yuchao Liu, Liang Yao, Wenjing Zhang, Yuhao Wang, Xinkai Jiang, Fusen Li, Qiu Xu:
SEU Fault Injection Strategy for SRAM-based FPGA User Memory Based on Dual-Circuit Model. 75-84 - M. Shafkat M. Khan, Chengjie Xi, Nitin Varshney, Je-Hyeong Bahk, Navid Asadizanjani:
Inherent Hardware Identifiers: Advancing IC Traceability and Provenance in the Multi-Die Era. 85-107
Volume 41, Number 2, April 2025
- Vishwani D. Agrawal:
Editorial. 109-110 - Chloe Tain, Savita Patil, Hussain Al-Asaad:
Survey of Verification of RISC-V Processors. 111-138 - K. N. Baluprithviraj, Vijayachitra Senniappan, N. Mahesh:
Logic Locking Based Configurable Obfuscation Cell for Enhanced IC Security. 139-146 - Xiaozhi Du, Kai Chen, Zongbin Qiao:
A Multi-Objective Test Scenario Prioritization Method Based on UML Activity Diagram. 147-171 - Gajender Rao, Deepak Nandal:
Test Case Optimization using Machine Learning based Hybrid Meta-Heuristic Approach. 173-192 - Enrico Magliano, Alessandro Savino, Stefano Di Carlo:
Real-time Embedded System Fault Injector Framework for Micro-architectural State Based Reliability Assessment. 193-208 - Hanieh Jafarzadeh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich:
Small Delay Fault Testing with Multiple Voltages under Variations: Defect vs. Fault Coverage. 209-219 - Suman Biswas, Gautam Kumar Mahanti, Nilanjan Chattaraj:
Extreme Learning Machine Model For Multi-Fault Diagnosis of Analog Circuits. 221-239 - Janusz Rajski, Maciej Trawka, Jerzy Tyszer, Bartosz Wlodarczak:
Hybrid Ring Generators for In-System Testing. 241-253
Volume 41, Number 3, June 2025
- Vishwani D. Agrawal:
Editorial. 255-256 - Sami El Amraoui, Aghiles Douadi, Régis Leveugle, Paolo Maistri:
On the Harmonic Locking of Ring Oscillators under Single ElectroMagnetic Pulsed Fault Injection in FPGAs. 257-272 - Junchao Chen, Li Lu, Marko S. Andjelkovic, Fabian Luis Vargas, Milos Krstic:
Dynamic Fault Mitigation for Space Radiation Using Fault Injection and Machine Learning. 273-285 - Marko S. Andjelkovic, Milos Krstic:
Analysis and Modeling of Single Event Transient Generation in Standard Combinational Cells. 287-302 - Munish Malik, Neelam Rup Prakash, Ajay Kumar, Jasbir Kaur, Amit Singh, Kavita Monga:
Analyzing the Effectiveness of Various NMOS Layouts for Total Ionizing Dose Hardening in 180nm CMOS. 303-312 - G. Prabu, C. Sujatha, J. Erin Shine, T. Arulkumar:
SFFHO: Development of Statistical Fitness-based Fire Hawk Optimizer for Software Testing and Maintenance Approach using Adaptive Deep Learning Method. 313-338 - Zhenqiu Li, Tingting Wu, Sihui Chen, Mingyue Jiang, Zuohua Ding, Yunwei Dong:
Cross-Domain Multi-Label Prediction of Metamorphic Relation Patterns Leveraging Multimodal Features. 339-358 - Rezgar Sadeghi, Amirhossein Ilkhani, Amirhosein Yazdanpanah:
Uncertainty-Aware Crosstalk Predictors for Adaptive Reliability in Core Interconnects. 359-371 - Riaz-ul-haque Mian, Foisal Ahmed, Yoshito Hagihara, Souma Yamane:
Custom-Adaptive Kernel Strategies for Gaussian Process Regression in Wafer-Level Modeling and FPGA Delay Analysis. 373-386 - Amit Mondal, Tuhina Samanta:
Artificial Neural Network Based Prediction Model for IR Drop Measurement in a VLSI Power Delivery Network. 387-406
Volume 41, Number 4, August 2025
- Vishwani D. Agrawal:
Editorial. 407-408 - Sushil Doranga Joins JETTA Editorial Board. 409
- Xianjun Du, Shenglong Jia, Yuxiang Hu, Yaqi Wang:
Fault Diagnosis of Analog Circuits Using an Improved BiTCN Combined with BiLSTM. 411-430 - Yao Li, Yan Gao, GuoZhen Hu, Guoqing Huang, Liang Zhao, Yan Sun, Weihua Yu:
Failure Analysis and Power-on Sequence Optimization for InP DHBT Stacked Amplifiers. 431-439 - Zhijun Yue, Ling He, Jin He, Guanci Yang, Yi Yang, Yinhong An:
A Method of Redundant Feature Suppression in Circuit Output Positions for Analog Circuit Soft and Hard Fault Diagnosis. 441-465 - Vijaypal Singh Rathor, Akshat Rastogi:
HT-Pred: An Extensive Methodology for Dataset Preparation and Hardware Trojan Prediction using Gate-Level Netlist. 467-482 - Wenbing Xie, Ruixue Guan, Fanyue Yu, Yiming Zhang:
PrecIRisc: A High-Precision and Low-Bloat Dynamic Binary Instrumentation Tailored for RISC Architectures. 483-502 - Aditya Kumar Singh Pundir, Pallavi Singh, Ramesh Kumar, Manish Kumar Singla:
Modelling, Simulation, and FPGA Implementation of an Augmented Memory Built-in Self-Test Based Design for Bit-Oriented Memory. 503-523 - Djiddo Ali Oumar, Mahamat Issa Boukhari, Stéphane Capraro, D. Piétroy, J. P. Chatelon, Jean Jacques Rousseau:
Calibration Impact on the Characterization of Components at Temperature. 525-543 - Sana Nasri, Nadeem Ahmad, Qurat Ul Ain Aini, Atif Qayyum, Naeem Ul Islam:
A YOLOv9: Deep Learning-based Framework Defect Detection Method for PCBs. 545-559 - Xudong Song, Xiumin Song:
SNF-YOLOv8: A Lightweight PCB Defect Detection Algorithm base on Multiscale Feature Fusion and Attention Scale Sequence Fusion. 561-573 - Zong-Si Wu, Jenq-Shiou Leu:
Firmware-Driven Adaptive Clock Tuning for Electromagnetic Interference Tolerance in Automotive Systems. 575-579
Volume 41, Number 5, December 2025
- Vishwani D. Agrawal:
Editorial. 581-582 - 2024 JETTA-TTTC Best Paper Award. 583-585
- Na Yang, Shuhao Jiang, Yun Wang, Qing Miao:
SD2CI: A Structure-driven Approach for Detecting Silent Data Corruption Instructions. 587-602 - Jun Yuan, Liangrui Zhang, Yuyang Zhang:
Chebyshev-based Algorithm: Achieving Fast ADC Static Parameter Testing Using a Low-precision Signal Source. 603-613 - María Isabel Dieste-Velasco:
Enhanced Monte Carlo-Based Uncertainty Quantification in Electronic Circuits. 615-629 - Sanjiv Sharma, Ankur Bhardwaj, Amar Singh, Vinay Singh:
Enhanced Moth Flame Optimization Algorithm Entropy-Based Centroid SVM-Based Software Defect Prediction. 631-649 - Bahman Arasteh, Faruk Bulut, Ibrahim Furkan Ince, Seyed Salar Sefati, Huseyin Kusetogullari, Farzad Kiani:
A Metaheuristic and Neural Network-Based Framework for Automated Software Test Oracles Under Limited Test Data Conditions. 651-671 - Bahman Arasteh, Seyed Salar Sefati, Peri Gunes, Vahid Hosseinzadeh, Farzad Kiani:
A Program-Output Estimator for Software Testing Using Program Analysis and Deep Learning Algorithms. 673-689 - Kiran Kumar Bhadavath, Vijayakumar Sajjan, Narsaiah Domala, Ashok Kumar Konduru, Sreedhar Jadapalli, Ramadevi Vemula:
Enhancing Digital VLSI Circuit Debugging with Unified Neighbor aware Graph Neural Network Based Automated Error Detection. 691-708 - Shreevatsa Alawandi, Kaushik Mallibhat, Umer Kudachi, Aishwarya Beedanal:
PCB Defects: A Unified Survey of Trends, Detection Techniques, and Limitations through Systematic Literature Review. 709-787 - Shreevatsa Alawandi, Kaushik Mallibhat, Umer Kudachi, Aishwarya Beedanal:
Correction: PCB Defects: a Unified Survey of Trends, Detection Techniques, and Limitations Through Systematic Literature Review. 789 - Gustavo Aguirre, Víctor H. Champac, Freddy Forero, Michel Renovell, Leonardo Miceli:
A Novel Defect Model Induced by a Single Dust Particle Contamination in the FinFET Gate Fingers. 791-803 - Gustavo Paz Platcheck, Guilherme Schwanke Cardoso, Tiago R. Balen:
Variability and Analog Parameter Characterization in Enclosed Layout Transistors. 805-821
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