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"RF Leakage in Embedded Devices: Security and Reliability Risks."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Erez Danieli et al. (2026)

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DOI: 10.1109/MDAT.2025.3602736

access: closed

type: Journal Article

metadata version: 2026-01-29

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Erez Danieli, Yoav Weizman, David Popovtzer, Itamar Levi:
RF Leakage in Embedded Devices: Security and Reliability Risks. IEEE Des. Test 43(1): 58-71 (2026)

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last updated on 2026-01-29 17:41 CET by the dblp team

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