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ORCIDIEEE Design & Test (D&T), Volume 43
Volume 43, Number 1, February 2026
- Partha Pratim Pande
:
Special Issue on Emerging Challenges With 3-D NAND Flash Storage. 4 - Biswajit Ray, Shyam Raghunathan, Sudeep Pasricha:
Special Issue on Emerging Challenges With 3-D NAND Flash Storage. 5-6 - Biswajit Ray, Shyam Raghunathan, Sudeep Pasricha:
Reliability, Security, and Sustainability Challenges in 3-D NAND Flash SSDs. 7-22 - Hajime Sano, Hitomi Tanaka, Reika Ichihara, Yuta Aiba, Kazuma Hasegawa, Chieko Tokunaga, Tatsuya Watanabe, Yasuhito Yoshimizu, Tomoya Sanuki:
Circular SSDs Enabled by Recoverable 3-D Flash Memory. 23-29 - Cristian Zambelli, Rino Micheloni:
Addressing the Cross-Temperature Issue in 3-D NAND Flash Memories: Characterization and Mitigation for Solid-State Drives. 30-40 - Hyeunjoo Kim, Sanghun Oh, Jaeyong Lee, Jihong Kim:
Lazy Discharge: A High- Speed Energy-Efficient Read Technique for NAND Flash Memory. 49-57 - Erez Danieli, Yoav Weizman, David Popovtzer, Itamar Levi:
RF Leakage in Embedded Devices: Security and Reliability Risks. 58-71 - Zong-Si Wu, Jenq-Shiou Leu:
SoC-GPIO-Based Dynamic Power Noise Control for Video Sensor Applications. 72-82 - Kapil Dev, Jerald Yoo, Younghyun Kim, Srividhya Venkataraman:
Celebrating Three Decades of IEEE/ACM International Symposium on Low Power Electronics and Design. 83-86 - Tei-Wei Kuo, Andy D. Pimentel, Yuan-Hao Chang, Jen-Wei Hsieh:
Report on the 2025 Embedded Systems Week (ESWEEK). 87-89 - Scott Davidson:
On the Origin of AI Species. 90 - Po-Kai Hsu, Weihong Xu, Minji Shon, Zijian Zhao, Kai Ni, Tajana Rosing, Shimeng Yu:
3-D Ferroelectric NAND In-Storage Processing Architecture for Mass Spectrometry. 41-48
Volume 43, Number 2, April 2026
- Partha Pratim Pande:
Special Issue Dedicated to the 2024 Symposium on Integrated Circuits and Systems Design (SBCCI). 4 - José Augusto Miranda Nacif, Omar Paranaiba Vilela Neto:
SBCCI 2024. 5-6 - Ana Italiano, Luciana Faletti Almeida, Thiago Brito, Mariane R. Petraglia, Fabián Olivera:
EAVREF: An Evolutionary-Algorithm-Based Tool for Low-Power CMOS Voltage Reference Designs. 7-16 - Tawan Chrysther dos Santos, Alessandro Gonçalves Girardi, Paulo César Comassetto de Aguirre:
The VCR Effect in Active-RC Continuous-Time Sigma-Delta Modulators. 17-25 - Léo dos Santos Ribeiro, Morgana Macedo Azevedo da Rosa, Rafael Iankowski Soares, Eduardo Antônio César da Costa:
Low-Power Truncated Pan-Tompkins Architecture Exploring Approximate Radix-2m Squaring Units. 26-35 - Eduardo Marañon Aguilar, Fabio Benevenuti, Fernanda L. Kastensmidt, Nilberto H. Medina, Nemitala Added, Vitor A. P. de Aguiar, Marcilei Aparecida Guazzelli:
Impact of Partial TMR on RISC-V Processor Reliability. 36-45 - Angelo Elias Dalzotto, Fernando Gehm Moraes:
Threat Detection in NoC-Based Manycores Using Lightweight Machine-Learning Models. 46-53 - Leonardo Augusto, Vitor Arguilar, Thiago L. T. da Silveira, Mateus Grellert:
Exploring Asymmetric Autoencoder Architectures for Computationally Efficient Neural Image Compression. 54-63 - Denis Maass, Marcello M. Muñoz, Murilo R. Perleberg, Luciano Agostini, Marcelo Schiavon Porto:
A Real-Time Hardware for LES Solving and ΔMV Calculation in VVC Affine Prediction. 64-71 - Sankar Basu, Erik Brunvand:
Semiconductor Microelectronics and Nanoelectronics Research and Education in Academia. 72-91 - Tharini Suresh, Salma Afifi, Sudeep Pasricha:
DiffLight: Generative Diffusion Model Acceleration With Silicon Photonics. 92-100 - Scott Davidson:
The Internet Likes to Watch. 101
Volume 43, Number 3, June 2026
- Partha Pratim Pande:
Advancing Design, Reliability, and Security in Modern Electronic Systems. 4 - Jayanth Thangellamudi, Sai Manoj Pudukotai Dinakarrao:
Bridging RTL and Assertion Generation With Large Language Models. 5-13 - Anuj Dubey, Aydin Aysu, Rosario Cammarota:
ASIC Tape-Out of the First Side-Channel-Protected Neural Network Design. 14-22 - Neha Gupta, Lomash Chandra Acharya, Khoirom Johnson Singh, Mahipal Dargupally, Neeraj Mishra, Arvind Kumar Sharma, Ajoy Mandal, Ramakrishnan Venkatraman, Sudeb Dasgupta, Anand Bulusu:
Aging-Aware Timing Models for Reliability Enhancement of Inverter-Transmission Gate-Based Circuits. 23-29 - Yuqian Pan, Runze Yu, Zhaoxu Wang, Xuepeng Zhou, Rui Zhang, Zhenglin Liu:
Evaluating 3-D Flash Memory Retention Reliability Under Temperature Elevation. 30-36 - Anirban Sengupta, Nabendu Bhui:
Detecting HLS Hardware Trojans Using Random Forest Classifier. 37-44 - Dakshina Tharindu, Aruna Jayasena, Prabhat Mishra:
A Tutorial on Secure and Efficient Firmware Delivery. 45-51 - Robert Wille, Tsung-Yi Ho, Deming Chen, Ron Duncan, Ismail S. K. Bustany, Caroline Kravec:
ICCAD 2025: First Time Outside the United States and a Record-Breaking Edition. 52-54 - Tsung-Yi Ho, Seokhyeong Kang, Takashi Sato:
ASP-DAC 2026: Strengthening Asia's Expanding Role in Design Automation Research. 55-57 - Scott Davidson:
Safe from Prying Eyes. 61
Volume 43, Number 4, August 2026
- Partha Pratim Pande:
Special Issue on Top Picks in VLSI Test and Reliability 2024. 4 - Marcello Traiola:
Special Issue on the 2024 IEEE Top Picks in VLSI Test and Reliability Workshop. 5-7 - Shamik Kundu, Sanjay Das, Anand Menon, Swastik Bhattacharya, Arnab Raha, Kanad Basu:
The Fault in Our Chips: A Survey on Edge AI Accelerator Vulnerabilities. 8-24 - Zitao Chen, Guanpeng Li, Karthik Pattabiraman:
A Low-Cost Fault Corrector for Deep Neural Networks Through Range Restriction. 25-31 - Leon Li, Alex Orailoglu:
Residual Structural Traces in Logic Locking: Insights From Redundancy Analysis and Beyond. 32-47 - Natalia Cherezova, Mohammad Hasan Ahmadilivani, Jaan Raik, Masoud Daneshtalab, Maksim Jenihhin:
Can Model-Level Fault Tolerance Be Enough for DNN Hardware Accelerators? A Study. 48-57 - Lingling Wei, Aoyun Sun, Zhang Zhang:
A Time-Based, Fast-Transient, Capacitor-Less NMOS LDO for a Wide Range of On-Chip Capacitive Loads. 58-68 - Hsiao-Ping Ni, Krishnendu Chakrabarty:
Silicon Lifecycle Management: From Telemetry to Dependability. 69-85 - Valeria Bertacco, Alberto Bosio, Robert Wille, Lukás Sekanina:
Date 2026 in Verona: Steady Growth, Industry Engagement, and Community in a Historic Setting. 86-92 - Scott Davidson:
The Ultimate Source of Knowledge. 93
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