"Sequential test generation with reduced test clocks for partial scan designs."

Soo Young Lee, Kewal K. Saluja (1994)

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DOI: 10.1109/VTEST.1994.292309

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Soo Young Lee, Kewal K. Saluja:
Sequential test generation with reduced test clocks for partial scan designs. VTS 1994: 220-225

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