"Realization of fully path-delay-fault testable non-scan sequential circuits."

Wuudiann Ke, Premachandran R. Menon (1994)

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DOI: 10.1109/VTEST.1994.292300

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Wuudiann Ke, Premachandran R. Menon:
Realization of fully path-delay-fault testable non-scan sequential circuits. VTS 1994: 278-283

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