"On robustness of required random test length with regard to fault ..."

Sophie Crépaux-Motte, Mireille Jacomino, René David (1994)

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DOI: 10.1109/VTEST.1994.292290

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-05

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Sophie Crépaux-Motte, Mireille Jacomino, René David:
On robustness of required random test length with regard to fault occurrence hypotheses. VTS 1994: 348-355

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