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ORCID"RF Design-Oriented ACM Model Generation Using Parametric Test and Machine ..."
- Catalin Andrei Dobrin, Deni Germano Alves Neto, D. Gaidioz, Philippe Cathelin, Sylvain Bourdel, Manuel J. Barragán:
RF Design-Oriented ACM Model Generation Using Parametric Test and Machine Learning Regression in 28nm FD-SOI CMOS Technology. LASCAS 2026: 1-5
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