"Study of Avalanche Behavior in 3 kV GaN Vertical P-N Diode Under UIS ..."

Bhawani Shankar et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764525

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Bhawani Shankar, Zhengliang Bian, Ke Zeng, Chuanzhe Meng, Rafael Perez Martinez, Srabanti Chowdhury, Brendan Gunning, Jack Flicker, Andrew Binder, Jeramy Ray Dickerson, Robert Kaplar:
Study of Avalanche Behavior in 3 kV GaN Vertical P-N Diode Under UIS Stress for Edge-termination Optimization. IRPS 2022: 2

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