"Extreme Temperature Automotive Testing."

Ben Lok et al. (2024)

> Home

Details and statistics

DOI: 10.1109/DTTIS62212.2024.10780427

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-16

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/dttis/LokDPMSWDTD24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dttis/LokDPMSWDTD24
Ben Lok, Si Diep, Thomas Pham, Nicholas Madrid, Mit Shah, Andrew Westall, Hamzeh Dessouki, Linh Truong, Andrew Davis:
Extreme Temperature Automotive Testing. DTTIS 2024: 1-8

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.