"Experimental Study of Force Induced by Probe Length Influence on ..."

Cedric Hermet et al. (2024)

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DOI: 10.1109/DTTIS62212.2024.10780125

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-16

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Cedric Hermet, Luc Favre, Stéphanie Escoubas, Salvatore De Siena, Robert Diperi:
Experimental Study of Force Induced by Probe Length Influence on Electrical Contact Resistance of Pillar Bump-Flat Vertical Probe Interaction during Wafer Electrical Test. DTTIS 2024: 1-6

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