"Punch-through variability in buried channel transistors."

Celine Belabbas et al. (2024)

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DOI: 10.1109/DTTIS62212.2024.10780055

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type: Conference or Workshop Paper

metadata version: 2025-01-16

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Celine Belabbas, S. Perrin, R. Habhab, V. Della Marca, P. Masson, P. Canet, J.-M. Portal, T. Kempf, N. Miridi, M. Mantelli, S. Niel, A. Regnier:
Punch-through variability in buried channel transistors. DTTIS 2024: 1-5

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