"Movement of Current Filaments and its Impact on Avalanche Robustness in ..."

Bhawani Shankar et al. (2022)

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DOI: 10.1109/DRC55272.2022.9855818

access: closed

type: Conference or Workshop Paper

metadata version: 2022-08-30

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Bhawani Shankar, Ke Zeng, Brendan Gunning, Rafael Perez Martinez, Chuanzhe Meng, Jack Flicker, Andrew Binder, Jeramy Ray Dickerson, Robert Kaplar, Srabanti Chowdhury:
Movement of Current Filaments and its Impact on Avalanche Robustness in Vertical GaN P-N diode Under UIS stress. DRC 2022: 1-2

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