IEEE Design & Test of Computers, Volume 17

Volume 17, Number 1, January-March 2000

EIC Message

• 
  Yervant Zorian:
  Flexibility and Programmability. IEEE Des. Test Comput. 17(1): 3- (2000)

News

• 
  News. IEEE Des. Test Comput. 17(1): 4-6 (2000)

Article

• 
  Patrick P. Gelsinger:
  Discontinuities Driven by a Billion Connected Machines. 7-15

Feature

• 
  Fadi J. Kurdahi, Nader Bagherzadeh, Peter Athanas, Jose L. Muñoz:
  Guest Editors' Introduction: Configurable Computing. IEEE Des. Test Comput. 17(1): 17-19 (2000)
• 
  Brad L. Hutchings, Brent E. Nelson, Michael J. Wirthlin:
  Designing and Debugging Custom Computing Applications. 20-28
• 
  Nirmal R. Saxena, Santiago Fernández-Gomez, Wei-Je Huang, Subhasish Mitra, Shu-Yi Yu, Edward J. McCluskey:
  Dependable Computing and Online Testing in Adaptive and Configurable Systems. 29-41
• 
  Bingxiong Xu, David H. Albonesi:
  Runtime Reconfiguration Techniques for Efficient General-Purpose Computation. 42-52
• 
  Daler N. Rakhmatov, Sarma B. K. Vrudhula, Thomas J. Brown, Ajay Nagarandal:
  Adaptive Multiuser Online Reconfigurable Engine. 53-67
• 
  Kia Bazargan, Ryan Kastner, Majid Sarrafzadeh:
  Fast Template Placement for Reconfigurable Computing Systems. 68-83
• 
  Sergio López-Buedo, Javier Garrido Salas, Eduardo I. Boemo:
  Thermal Testing on Reconfigurable Computers. 84-91

Special Feature

• 
  Hardware-Software Codesign. IEEE Des. Test Comput. 17(1): 92-99 (2000)

Standards

• 
  Mukund Modi:
  TTTC Reports on Recent Standards Activities. IEEE Des. Test Comput. 17(1): 100-101 (2000)

Panel Summaries

• 
  Panel Summaries. IEEE Des. Test Comput. 17(1): 102-105 (2000)

Conference Reports

• 
  Conference Reports. IEEE Des. Test Comput. 17(1): 106-107 (2000)

TTTC Newsletter

• 
  TTTC Newsletter. IEEE Des. Test Comput. 17(1): 108-109 (2000)

DATC Newsletter

• 
  DATC Newsletter. IEEE Des. Test Comput. 17(1): 110- (2000)

The Last Byte

• 
  Scott Davidson:
  Twenty Years Ago Today. IEEE Des. Test Comput. 17(1): 111-112 (2000)

Volume 17, Number 2, April-June 2000

EIC Message

• 
  Yervant Zorian:
  Embedded in this issue. IEEE Des. Test Comput. 17(2): 5-6 (2000)

News

• 
  News. IEEE Des. Test Comput. 17(2): 6-9 (2000)

Feature

• 
  Donatella Sciuto:
  Guest Editor's Introduction: Design Tools for Embedded Systems. IEEE Des. Test Comput. 17(2): 11-13 (2000)
• 
  Marco Sgroi, Luciano Lavagno, Alberto L. Sangiovanni-Vincentelli:
  Formal Models for Embedded System Design. 14-27
• 
  Frank Slomka, Matthias Dörfel, Ralf Münzenberger, Richard Hofmann:
  Hardware/Software Codesign and Rapid Prototyping of Embedded Systems. 28-38
• 
  Margarida F. Jacome, Gustavo de Veciana:
  Design Challenges for New Application-Specific Processors. 40-50
• 
  Michael Eisenring, Lothar Thiele, Eckart Zitzler:
  Conflicting Criteria in Embedded System Design. 51-59
• 
  Alberto Allara, Massimo Bombana, William Fornaciari, Fabio Salice:
  A Case Study in Design Space Exploration: The Tosca Environment Applied to a Telecommunication Link Controller. 60-72
• 
  Luca Benini, Alberto Macii, Enrico Macii, Massimo Poncino:
  Increasing Energy Efficiency of Embedded Systems by Application-Specific Memory Hierarchy Generation. 74-85

Special Feature

• 
  Keith A. Jenkins, James P. Eckhardt:
  Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops. 86-93
• 
  Dilip K. Bhavsar:
  Synchronizing the IEEE 1149.1 Test Access Port for Chip-Level Testability. 94-99
• 
  Janardhan H. Satyanarayana, Keshab K. Parhi:
  Power Estimation of Digital Data Paths Using HEAT. 101-110
• 
  Hendrawan Soeleman, Kaushik Roy, Tan-Li Chou:
  Estimating Circuit Activity in Combinational CMOS Digital Circuits. 112-119
• 
  A D&T Roundtable: Design Automation in a Subwavelength Worl. IEEE Des. Test Comput. 17(2): 120-126 (2000)

Conference Reports

• 
  Conference Reports. IEEE Des. Test Comput. 17(2): 127-135 (2000)

Panel Summaries

• 
  Panel Summaries. IEEE Des. Test Comput. 17(2): 136-139 (2000)

DATC Newsletter

• 
  DATC Newsletter. IEEE Des. Test Comput. 17(2): 140- (2000)

TTTC Newsletter

• 
  TTTC Newsletter. IEEE Des. Test Comput. 17(2): 141- (2000)

Standards

• 
  Mukund Modi:
  SCC20 Reports on Recent Standards Activities. IEEE Des. Test Comput. 17(2): 142-143 (2000)

The Last Byte

• 
  In the Licensing Dungeon: CAD by the Minute. IEEE Des. Test Comput. 17(2): 143-144 (2000)

Volume 17, Number 3, July-September 2000

From the EIC

• 
  Yervant Zorian:
  Wider Coverage. 6-

News

• 
  News. IEEE Des. Test Comput. 17(3): 8-10 (2000)

Feature

• 
  Scott Davidson, Justin E. Harlow III:
  Guest Editors' Introduction: Benchmarking for Design and Test. 12-14
• 
  Justin E. Harlow III:
  Overview of Popular Benchmark Sets. 15-17
• 
  Rohit Kapur, Cy Hay, Thomas W. Williams:
  The Mutating Metric for Benchmarking Test. 18-21
• 
  Giulio Gorla, Eduard Moser, Wolfgang Nebel, Eugenio Villar:
  System Specification Experiments on a Common Benchmark. 22-32
• 
  Chouki Aktouf, Hérvé Fleury, Chantal Robach:
  Inserting Scan at the Behavioral Level. 34-42
• 
  Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero:
  RT-Level ITC'99 Benchmarks and First ATPG Results. 44-53
• 
  Luis Basto:
  First Results of ITC'99 Benchmark Circuits. 54-59
• 
  Sujit Dey, Debashis Panigrahi, Li Chen, Clark N. Taylor, Krishna Sekar, Pablo Sanchez:
  Using a Soft Core in a SoC Design: Experiences with picoJava. 60-71

Special Feature

• 
  Chien-Nan Jimmy Liu, Jing-Yang Jou:
  An Automatic Controller Extractor for HDL Descriptions at the RTL. 72-77
• 
  Axel Jantsch, Shashi Kumar, Ahmed Hemani:
  A Metamodel for Studying Concepts in Electronic System Design. 78-85
• 
  Rolf Clauberg, Peter Buchmann, Andreas Herkersdorf, David J. Webb:
  Design Methodology for a Large Communication Chip. 86-94
• 
  Mauro Bertacchi, Alessandro De Gloria, Daniele Grosso, Mauro Olivieri:
  Semicustom Design of an IEEE 1394-Compliant Reusable IC Core. 95-105
• 
  Pramodchandran N. Variyam, Abhijit Chatterjee:
  Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling. 106-115
• 
  Seung H. Hwang, Gwan S. Choi:
  A Reliability Testing Environment for Off-the-Shelf Memory Subsystems. 116-124
• 
  A D&T Roundtable: Test Resource Partitioning. IEEE Des. Test Comput. 17(3): 126-132 (2000)

Panel Summaries

• 
  Panel Summaries. IEEE Des. Test Comput. 17(3): 133-135 (2000)

Standards

• 
  Mukund Modi:
  TTTC Reports on Recent Standards Activities. IEEE Des. Test Comput. 17(3): 136-137 (2000)

DATC Newsletter

• 
  DATC Newsletter. IEEE Des. Test Comput. 17(3): 139- (2000)

TTTC Newsletter

• 
  TTTC Newsletter. IEEE Des. Test Comput. 17(3): 140-141 (2000)

The Last Byte

• 
  Franc Brglez:
  The Scientific Method and Design and Test. 142-144

Volume 17, Number 4, October-December 2000

From the EIC

• 
  D&T Elevated to Bimonthly. IEEE Des. Test Comput. 17(4): 3- (2000)

Feature

• 
  Magdy S. Abadir, Sumit Dasgupta:
  Guest Editors' Introduction: Microprocessor Test and Verification. IEEE Des. Test Comput. 17(4): 4-5 (2000)
• 
  Wei-Cheng Lai, Angela Krstic, Kwang-Ting (Tim) Cheng:
  Functionally Testable Path Delay Faults on a Microprocessor. 6-14
• 
  Nektarios Kranitis, Dimitris Gizopoulos, Antonis M. Paschalis, Mihalis Psarakis, Yervant Zorian:
  Power-/Energy Efficient BIST Schemes for Processor Data Paths. 15-28
• 
  Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran:
  Test Development for a Third-Version ColdFire Microprocessor. 29-37
• 
  Noppanunt Utamaphethai, R. D. (Shawn) Blanton, John Paul Shen:
  Effectiveness of Microarchitecture Test Program Generation. 38-49
• 
  David Van Campenhout, Trevor N. Mudge, John P. Hayes:
  Collection and Analysis of Microprocessor Design Errors. 51-60
• 
  Narayanan Krishnamurthy, Andrew K. Martin, Magdy S. Abadir, Jacob A. Abraham:
  Validating PowerPC Microprocessor Custom Memories. 61-76
• 
  Hemant G. Rotithor:
  Postsilicon Validation Methodology for Microprocessors. 77-88

Special Feature

• 
  Subhasish Mitra, LaNae J. Avra, Edward J. McCluskey:
  Efficient Multiplexer Synthesis Techniques. 90-97
• 
  A D&T Roundtable: Power Delivery and Distribution. 98-102

Standards

• 
  Standards. IEEE Des. Test Comput. 17(4): 102-103 (2000)

Panel Summaries

• 
  Panel Summaries. IEEE Des. Test Comput. 17(4): 104-105 (2000)

TTTC Newsletter

• 
  TTTC Newsletter. IEEE Des. Test Comput. 17(4): 106-107 (2000)

DATC Newsletter

• 
  DATC Newsletter. IEEE Des. Test Comput. 17(4): 108- (2000)

Annual Index

• 
  IEEE Design & Test of Computers 2000 Annual Index, Volume 17. IEEE Des. Test Comput. 17(4): 109-117 (2000)

The Last Byte

• 
  Scott Davidson:
  Testing in 2100. IEEE Des. Test Comput. 17(4): 119-120 (2000)