IEEE Design & Test of Computers, Volume 16

Volume 16, Number 1, January-March 1999

Message from the Editor-in-Chief

• 
  Yervant Zorian:
  Focus on DRAMs. IEEE Des. Test Comput. 16(1): 1- (1999)

News

• 
  News. IEEE Des. Test Comput. 16(1): 3-4 (1999)

Conference Reports

• 
  Conference Reports. IEEE Des. Test Comput. 16(1): 5- (1999)

Panel Summaries

• 
  Panel Summaries. IEEE Des. Test Comput. 16(1): 6-8, 90-91 (1999)

A D&T Profile

• 
  Dado Banatao: Profile of a Silicon Valley Entrepreneur. IEEE Des. Test Comput. 16(1): 9-15 (1999)

ITC Keynote

• 
  Robin Saxby, Peter Harrod:
  Test in the Emerging Intellectual Property Business. IEEE Des. Test Comput. 16(1): 16-18 (1999)

Feature

• 
  Bruce F. Cockburn, Fabrizio Lombardi, Fred J. Meyer:
  Guest Editors' Introduction: DRAM Architecture and Testing. IEEE Des. Test Comput. 16(1): 19-21 (1999)
• 
  Michael Redeker, Bruce F. Cockburn, Duncan G. Elliott:
  Fault Models and Tests for a 2-Bit-per-Cell MLDRAM. 22-31
• 
  Duncan G. Elliott, Michael Stumm, W. Martin Snelgrove, Christian Cojocaru, Robert McKenzie:
  Computational RAM: Implementing Processors in Memory. 32-41
• 
  J. Bruce Millar, Peter Gillingham:
  Two High-Bandwidth Memory Bus Structures. 42-52
• 
  Shinji Miyano, Katsuhiko Sato, Kenji Numata:
  Universal Test Interface for Embedded-DRAM Testing. 53-58
• 
  Chih-Tsun Huang, Jing-Reng Huang, Chi-Feng Wu, Cheng-Wen Wu, Tsin-Yuan Chang:
  A Programmable BIST Core for Embedded DRAM. 59-70

Special Feature

• 
  Kenneth M. Butler:
  Estimating the Economic Benefits of DFT. 71-79
• 
  A D&T Roundtable: Online Test. IEEE Des. Test Comput. 16(1): 80-86 (1999)

Standards

• 
  Mukund Modi:
  P1532, WAVES, and a New Initiative. IEEE Des. Test Comput. 16(1): 88-89 (1999)

DATC Newsletter

• 
  DATC Newsletter. IEEE Des. Test Comput. 16(1): 93- (1999)

TTTC Newsletter

• 
  TTTC Newsletter. IEEE Des. Test Comput. 16(1): 94-95 (1999)

The Last Byte

• 
  Al Crouch:
  The DFT Psychic Network. IEEE Des. Test Comput. 16(1): 96- (1999)

Volume 16, Number 2, April-June 1999

Message from the Editor-in-Chief

• 
  Variety at Its Best. IEEE Des. Test Comput. 16(2): 1- (1999)

News

• 
  News. IEEE Des. Test Comput. 16(2): 3-4 (1999)

Standards

• 
  Mukund Modi:
  Mixed-Signal Test Bus, Embedded Core Test Efforts Advance. IEEE Des. Test Comput. 16(2): 5-6, 93 (1999)

Conference Reports

• 
  Conference Reports. IEEE Des. Test Comput. 16(2): 7, 92-93 (1999)

A D&T Profile

• 
  Gordon E. Moore: A Pioneer Looks Back at Semiconductors. IEEE Des. Test Comput. 16(2): 8-14 (1999)

Feature

• 
  Vijay K. Madisetti:
  Guest Editor's Introduction: Reengineering Digital Systems. IEEE Des. Test Comput. 16(2): 15-16 (1999)
• 
  Ronald C. Stogdill:
  Dealing with Obsolete Parts. 17-25
• 
  Gregory H. Chisholm, Steven T. Eckmann, Christopher M. Lain, Robert Veroff:
  Understanding Integrated Circuits. 26-37
• 
  Vijay K. Madisetti, Yong-Kyu Jung, Moinul H. Khan, Jeongwook Kim, Theodore Finnessy:
  Reengineering Legacy Embedded Systems. 38-47
• 
  Rao R. Tummala, Vijay K. Madisetti:
  System on Chip or System on Package? 48-56

Special Feature

• 
  Manoj Sachdev, Hans G. Kerkhoff:
  Configurations for IDDQ-Testable PLAs. 58-65

FPGA Track

• 
  Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi:
  Design Verification of FPGA Implementations. 66-73
• 
  Alireza Kaviani, Stephen Brown:
  The Hybrid Field-Programmable Architecture. 74-83

FPGA Track: Roundtable

• 
  IC Reliability and Test: What Will Deep Submicron Bring? IEEE Des. Test Comput. 16(2): 84-91 (1999)

TTTC Newsletter

• 
  Test Technology TC Newsletter. IEEE Des. Test Comput. 16(2): 94-95 (1999)

The Last Byte

• 
  Scott Davidson:
  How Do I Boot Thee? Let Me Check Page 3. IEEE Des. Test Comput. 16(2): 96- (1999)

Volume 16, Number 3, July-September 1999

From the EIC

• 
  Yervant Zorian:
  D&T Expands. IEEE Des. Test Comput. 16(3): 6-7 (1999)

Letter to the Editor

• 
  Letter to the Editor. IEEE Des. Test Comput. 16(3): 8- (1999)

News

• 
  News. IEEE Des. Test Comput. 16(3): 8-10 (1999)

Article

• 
  Hugo De Man:
  System-on-Chip Design: Impact on Education and Research. 11-19

Feature

• 
  Tony Ambler, Ben Bennetts:
  Guest Editors' Introduction: Test and the Product Life Cycle. IEEE Des. Test Comput. 16(3): 20-22 (1999)
• 
  Jon Turino:
  Design for Test and Time to Market: A Personal Perspective. 23-27
• 
  Bernard Sutton:
  Board Test and the Product Life Cycle: Get Wise to Board Test. 28-33
• 
  Mike Wondolowski, Ben Bennetts, Adam W. Ley:
  Boundary Scan: The Internet of Test. 34-43
• 
  Bertram Weber:
  Automating PBX System Testing. 44-52
• 
  Susana Stoica:
  Generating Functional Design Verification Tests. 53-63

Special Feature

• 
  Charles F. Hawkins, Jaume Segura:
  Test and Reliability: Partners in IC Manufacturing, Part 1. 64-71
• 
  Mark C. Hansen, Hakan Yalcin, John P. Hayes:
  Unveiling the ISCAS-85 Benchmarks: A Case Study in Reverse Engineering. 72-80
• 
  Andreas Steininger, Christopher Temple:
  Economic Online Self-Test in the Time-Triggered Architecture. 81-89
• 
  Michael Nicolaidis, Ricardo de Oliveira Duarte:
  Fault-Secure Parity Prediction Booth Multipliers. 90-101
• 
  Lee Melatti, Barry Blancha:
  Testing Methodology for FireWire. 102-111
• 
  A D&T Roundtable: RF Integration into CMOS and Deep-Submicron Challenges. IEEE Des. Test Comput. 16(3): 112-116 (1999)

Panel Summaries

• 
  Panel Summaries. IEEE Des. Test Comput. 16(3): 118-119 (1999)

Conference Reports

• 
  International Mixed-Signal Testing Workshop 1999. IEEE Des. Test Comput. 16(3): 120- (1999)

Standards

• 
  Mukund Modi:
  Status Report on Standards Affecting Design and Test. IEEE Des. Test Comput. 16(3): 121-122 (1999)

DATC Newsletter

• 
  DATC Newsletter. IEEE Des. Test Comput. 16(3): 124-125 (1999)

TTTC Newsletter

• 
  TTTC Newsletter. IEEE Des. Test Comput. 16(3): 126-127 (1999)

The Last Byte

• 
  Stephen K. Sunter:
  Analog, digital, and mixed-signal people. IEEE Des. Test Comput. 16(3): 128- (1999)

Volume 16, Number 4, October-December 1999

EIC Message

• 
  Yervant Zorian:
  Integration Continues. IEEE Des. Test Comput. 16(4): 1- (1999)

News

• 
  News. IEEE Des. Test Comput. 16(4): 5-6 (1999)

Letter to the Editor

• 
  Letter to the Editor. IEEE Des. Test Comput. 16(4): 6- (1999)

Article

• 
  Terry Thomas:
  Technology for IP Reuse and Portability. 7-13

Special Feature

• 
  Charles F. Hawkins, Jerry M. Soden:
  Deep Submicron CMOS Current IC Testing: Is There a Future? IEEE Des. Test Comput. 16(4): 14-15 (1999)

Feature

• 
  Bernard Courtois, R. D. (Shawn) Blanton:
  Guest Editors' Introduction. IEEE Des. Test Comput. 16(4): 16-17 (1999)
• 
  Tamal Mukherjee, Gary K. Fedder, R. D. (Shawn) Blanton:
  Hierarchical Design and Test of Integrated Microsystems. 18-27
• 
  Salvador Mir, Benoît Charlot:
  On the Integration of Design and Test for Chips Embedding MEMS. 28-38
• 
  Nicholas R. Swart:
  A Design Flow for Micromachined Electromechanical Systems. 39-47
• 
  Alain Béliveau, Guy T. Spencer, Keith A. Thomas, Scott L. Roberson:
  Evaluation of MEMS Capacitive Accelerometers. 48-56
• 
  Edward K. Chan, Krishna Garikipati, Robert W. Dutton:
  Comprehensive Static Characterization of Vertical Electrostatically Actuated Polysilicon Beams. 58-65

Special Feature

• 
  Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin:
  Test and Reliability: Partners in IC Manufacturing, Part 2. 66-73
• 
  Peter J. Ashenden, Philip A. Wilsey:
  Protected Shared Variables in VHDL: IEEE Standard 1076a. 74-83
• 
  Ralph Mason, Shing Ma:
  Analog DFT Using an Undersampling Technique. 84-88
• 
  A D&T Roundtable: Design Automation in Europe. IEEE Des. Test Comput. 16(4): 90-95 (1999)

Panel Summaries

• 
  Dilip K. Bhavsar:
  ITC 99 Panels. IEEE Des. Test Comput. 16(4): 96-99 (1999)

Conference Reports

• 
  Conference Reports. IEEE Des. Test Comput. 16(4): 100-101 (1999)

Annual Index

• 
  IEEE Design & Test of Computers 1999 Annual Index, Volume 16. IEEE Des. Test Comput. 16(4): 102-108 (1999)

DATC Newsletter

• 
  DATC Newsletter. IEEE Des. Test Comput. 16(4): 109- (1999)

TTTC Newsletter

• 
  TTTC Newsletter. IEEE Des. Test Comput. 16(4): 110-111 (1999)

The Last Byte

• 
  Chris Rowen:
  Sailing on a Sea of Processors. IEEE Des. Test Comput. 16(4): 112- (1999)