"Fault Simulation and Transistor-Level Test Generation for Physical ..."

Hsi-Ching Shih (1986)

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type: Book or Thesis

metadata version: 2023-09-14

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Hsi-Ching Shih:
Fault Simulation and Transistor-Level Test Generation for Physical Failures in Mos Circuits. University of Illinois Urbana-Champaign, USA, 1986

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