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"Hot-carrier reliability evaluation for CMOS devices and circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Vei-Han Chan (1995)

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DOI: —

access: closed

type: Book or Thesis

metadata version: 2022-05-04

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  dblp key:
  - phd/ndltd/Chan95
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  persistent URL:
  - https://dblp.org/rec/phd/ndltd/Chan95
Vei-Han Chan:
Hot-carrier reliability evaluation for CMOS devices and circuits. Massachusetts Institute of Technology, Cambridge, MA, USA, 1995

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