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"Reducing Rollback Cost in VLSI Circuits to Improve Fault Tolerance."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Thierry Bonnoit, Nacer-Eddine Zergainoh, Michael Nicolaidis (2018)

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DOI: 10.1109/TVLSI.2018.2818021

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/BonnoitZN18
Thierry Bonnoit, Nacer-Eddine Zergainoh, Michael Nicolaidis:
Reducing Rollback Cost in VLSI Circuits to Improve Fault Tolerance. IEEE Trans. Very Large Scale Integr. Syst. 26(8): 1438-1451 (2018)

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