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"A reliability test-plan for series systems with components having ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

J. Hariharan Nair, Sanjeev V. Sabnis (2002)

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DOI: 10.1109/24.994899

access: closed

type: Journal Article

metadata version: 2020-07-09

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J. Hariharan Nair, Sanjeev V. Sabnis:
A reliability test-plan for series systems with components having stochastic failure rates. IEEE Trans. Reliab. 51(1): 17-22 (2002)

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