"The influence of electric-field bending on the nonlinearity of capacitive ..."

Xiujun Li, Gerben de Jong, Gerard C. M. Meijer (2000)

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DOI: 10.1109/19.843059

access: closed

type: Journal Article

metadata version: 2020-06-08

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Xiujun Li, Gerben de Jong, Gerard C. M. Meijer:
The influence of electric-field bending on the nonlinearity of capacitive sensors. IEEE Trans. Instrum. Meas. 49(2): 256-259 (2000)

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