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"Using data compression in automatic test equipment for system-on-chip testing."
Farzin Karimi et al. (2004)
- Farzin Karimi, Zainalabedin Navabi, Waleed Meleis, Fabrizio Lombardi:

Using data compression in automatic test equipment for system-on-chip testing. IEEE Trans. Instrum. Meas. 53(2): 308-317 (2004)

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