"Combined Anomaly Aware Weakly Supervised Lightweight Model for Surface ..."

Zhe Zhang et al. (2024)

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DOI: 10.1109/TII.2023.3348835

access: closed

type: Journal Article

metadata version: 2025-12-05

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Zhe Zhang, Zhenqiao Shang, Xin Wang, Jie Ma:
Combined Anomaly Aware Weakly Supervised Lightweight Model for Surface Defect Inspection. IEEE Trans. Ind. Informatics 20(4): 6652-6663 (2024)

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