"An Online Condition Monitoring Method for IGBT Gate Oxide Degradation ..."

Allahyar Moazami, Sadegh Mohsenzade, Khatereh Akbari (2023)

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DOI: 10.1109/TIE.2022.3210581

access: closed

type: Journal Article

metadata version: 2023-04-29

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Allahyar Moazami, Sadegh Mohsenzade, Khatereh Akbari:
An Online Condition Monitoring Method for IGBT Gate Oxide Degradation Based on the Gate Current in Miller Plateau. IEEE Trans. Ind. Electron. 70(9): 9505-9514 (2023)

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