"Anomaly Detection Reliability in Consumer Electronics Manufacturing."

Chuen-Wun Pai, Hung-Wei Hsueh, Shu-Han Hsu (2025)

> Home

Details and statistics

DOI: 10.1109/TCE.2025.3626738

access: closed

type: Journal Article

metadata version: 2026-01-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tce/PaiHH25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tce/PaiHH25
Chuen-Wun Pai, Hung-Wei Hsueh, Shu-Han Hsu:
Anomaly Detection Reliability in Consumer Electronics Manufacturing. IEEE Trans. Consumer Electron. 71(4): 9287-9300 (2025)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.