"An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time."

Hyunggoy Oh et al. (2017)

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DOI: 10.1109/TC.2016.2561920

access: closed

type: Journal Article

metadata version: 2025-12-07

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Hyunggoy Oh, Taewoo Han, Inhyuk Choi, Sungho Kang:
An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time. IEEE Trans. Computers 66(1): 38-44 (2017)

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