"DRAM-Based Error Detection Method to Reduce the Post-Silicon Debug Time ..."

Hyunggoy Oh, Inhyuk Choi, Sungho Kang (2017)

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DOI: 10.1109/TC.2017.2678504

access: closed

type: Journal Article

metadata version: 2024-02-27

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Hyunggoy Oh, Inhyuk Choi, Sungho Kang:
DRAM-Based Error Detection Method to Reduce the Post-Silicon Debug Time for Multiple Identical Cores. IEEE Trans. Computers 66(9): 1504-1517 (2017)

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