"Model correction and updating of a stochastic degradation model for ..."

Chen Jiang et al. (2022)

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DOI: 10.1016/J.RESS.2021.108203

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type: Journal Article

metadata version: 2021-12-10

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Chen Jiang, Manuel A. Vega, Michael D. Todd, Zhen Hu:
Model correction and updating of a stochastic degradation model for failure prognostics of miter gates. Reliab. Eng. Syst. Saf. 218(Part): 108203 (2022)

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