"Machine learning-based tools to model and to remove the off-target effect."

Riwal Lefort et al. (2017)

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DOI: 10.1007/S10044-015-0469-Z

access: closed

type: Journal Article

metadata version: 2017-05-20

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  - https://dblp.org/rec/journals/paa/LefortFPF17
Riwal Lefort, Ludovico Fusco, Olivier Pertz, François Fleuret:
Machine learning-based tools to model and to remove the off-target effect. Pattern Anal. Appl. 20(1): 87-100 (2017)

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