"Learning from ambiguous labels for X-Ray security inspection via weakly ..."

Wei Wang et al. (2024)

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DOI: 10.1007/S11042-023-15299-9

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type: Journal Article

metadata version: 2025-08-05

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Wei Wang, Linyang He, Guohua Cheng, Ting Wen, Yan Tian:
Learning from ambiguous labels for X-Ray security inspection via weakly supervised correction. Multim. Tools Appl. 83(2): 6319-6334 (2024)

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