"Monitoring chip fatigue in an IGBT module based on grey relational analysis."

Shengqi Zhou et al. (2016)

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DOI: 10.1016/J.MICROREL.2015.10.027

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/ZhouZYLLSW16
Shengqi Zhou, Luowei Zhou, Litao Yu, Sucheng Liu, Quanming Luo, Pengju Sun, Junke Wu:
Monitoring chip fatigue in an IGBT module based on grey relational analysis. Microelectron. Reliab. 56: 49-52 (2016)

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