"An investigation of drain pulse induced hot carrier degradation in n-type ..."

Meng Zhang, Mingxiang Wang (2010)

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DOI: 10.1016/J.MICROREL.2010.01.024

access: closed

type: Journal Article

metadata version: 2020-02-22

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Meng Zhang, Mingxiang Wang:
An investigation of drain pulse induced hot carrier degradation in n-type low temperature polycrystalline silicon thin film transistors. Microelectron. Reliab. 50(5): 713-716 (2010)

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