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"Analysis of high power microwave induced degradation and damage effects in ..."
Xinhai Yu et al. (2015)
- Xinhai Yu, Changchun Chai, Yang Liu, Yintang Yang, Qingyang Fan:

Analysis of high power microwave induced degradation and damage effects in AlGaAs/InGaAs pHEMTs. Microelectron. Reliab. 55(8): 1174-1179 (2015)

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