"Light degradation test and design of thermal performance for high-power ..."

Yen-Fu Su et al. (2012)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2011.07.059

access: closed

type: Journal Article

metadata version: 2024-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/SuYHLC12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/SuYHLC12
Yen-Fu Su, Shin-Yueh Yang, Tuan-Yu Hung, Chang-Chun Lee, Kuo-Ning Chiang:
Light degradation test and design of thermal performance for high-power light-emitting diodes. Microelectron. Reliab. 52(5): 794-803 (2012)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.