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"Optimization of gate poly TAB size and reliability on short channel pMOSFET."
Jung-Eun Seok et al. (2008)
- Jung-Eun Seok, Hyun-Joo Kim, Jae-Yong Seo, Sam-jin Hwang, Byung-Heon Kwak:

Optimization of gate poly TAB size and reliability on short channel pMOSFET. Microelectron. Reliab. 48(8-9): 1185-1188 (2008)

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