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"Evaluation of scanning capacitance microscopy sample preparation by ..."
Nicolas Rodriguez et al. (2006)
- Nicolas Rodriguez, Jérôme Adrian, Catherine Grosjean, Gérald Haller, Christophe Girardeaux, Alain Portavoce

:
Evaluation of scanning capacitance microscopy sample preparation by focused ion beam. Microelectron. Reliab. 46(9-11): 1554-1557 (2006)

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