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"New experimental approach for failure prediction in electronics: ..."
Isaline Richard, Romain Fayolle, Jean-Claude Lecomte (2005)
- Isaline Richard, Romain Fayolle, Jean-Claude Lecomte:

New experimental approach for failure prediction in electronics: Topography and deformation measurement complemented with acoustic microscopy. Microelectron. Reliab. 45(9-11): 1645-1651 (2005)

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