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"Threshold voltage instability characteristics of HfO2 ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Se Jong Rhee, Jack C. Lee (2005)

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DOI: 10.1016/J.MICROREL.2005.01.006

access: closed

type: Journal Article

metadata version: 2020-02-22

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Se Jong Rhee, Jack C. Lee:
Threshold voltage instability characteristics of HfO₂ dielectrics n-MOSFETs. Microelectron. Reliab. 45(7-8): 1051-1060 (2005)

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