"Electrical characteristics of high-energy proton irradiated ultra-thin ..."

Joan Marc Rafí et al. (2002)

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DOI: 10.1016/S0026-2714(02)00178-6

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type: Journal Article

metadata version: 2024-10-06

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Joan Marc Rafí, B. Vergnet, Francesca Campabadal, Celeste Fleta, Luis Fonseca, Manuel Lozano, C. Martínez, Miguel Ullán:
Electrical characteristics of high-energy proton irradiated ultra-thin gate oxides. Microelectron. Reliab. 42(9-11): 1501-1504 (2002)

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