"Voltage acceleration of time-dependent breakdown of ultra-thin gate ..."

Thomas Pompl, Michael Röhner (2005)

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DOI: 10.1016/J.MICROREL.2005.04.007

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type: Journal Article

metadata version: 2020-02-22

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Thomas Pompl, Michael Röhner:
Voltage acceleration of time-dependent breakdown of ultra-thin gate dielectrics. Microelectron. Reliab. 45(12): 1835-1841 (2005)

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