"A prognostic approach for non-punch through and field stop IGBTs."

Nishad Patil, Diganta Das, Michael G. Pecht (2012)

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DOI: 10.1016/J.MICROREL.2011.10.017

access: closed

type: Journal Article

metadata version: 2020-02-22

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Nishad Patil, Diganta Das, Michael G. Pecht:
A prognostic approach for non-punch through and field stop IGBTs. Microelectron. Reliab. 52(3): 482-488 (2012)

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