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"A compact model for early electromigration failures of copper ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

R. L. de Orio, Hajdin Ceric, Siegfried Selberherr (2011)

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DOI: 10.1016/J.MICROREL.2011.07.049

access: open

type: Journal Article

metadata version: 2025-06-15

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R. L. de Orio, Hajdin Ceric, Siegfried Selberherr:
A compact model for early electromigration failures of copper dual-damascene interconnects. Microelectron. Reliab. 51(9-11): 1573-1577 (2011)

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