"Impact of neutron irradiation on the RF properties of oxidized ..."

C. Roda Neve et al. (2011)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2010.07.153

access: closed

type: Journal Article

metadata version: 2021-12-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/NeveKALMFR11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/NeveKALMFR11
C. Roda Neve, Valeria Kilchytska, Joaquín Alvarado, Dimitri Lederer, O. Militaru, Denis Flandre, Jean-Pierre Raskin:
Impact of neutron irradiation on the RF properties of oxidized high-resistivity silicon substrates with and without a trap-rich passivation layer. Microelectron. Reliab. 51(2): 326-331 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.