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"Reliability and diffusion-controlled through thickness oxidation of ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

M. Yazdan Mehr et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.08.014

access: closed

type: Journal Article

metadata version: 2025-11-23

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M. Yazdan Mehr, Mohammad Reza Toroghinejad, F. Karimzadeh, W. D. van Driel, G. Q. Zhang:
Reliability and diffusion-controlled through thickness oxidation of optical materials in LED-based products. Microelectron. Reliab. 78: 143-147 (2017)

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last updated on 2025-11-23 14:58 CET by the dblp team

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