"Life expectancy and characterization of capacitive RF MEMS switches."

Mohamed Matmat et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.064

access: closed

type: Journal Article

metadata version: 2020-02-22

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Mohamed Matmat, K. Koukos, Fabio Coccetti, T. Idda, Antoine Marty, Christophe Escriba, Jean-Yves Fourniols, Daniel Estève:
Life expectancy and characterization of capacitive RF MEMS switches. Microelectron. Reliab. 50(9-11): 1692-1696 (2010)

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