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"EBSD measurements of elastic strain fields in a GaN/sapphire structure."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

J. F. Luo et al. (2006)

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DOI: 10.1016/J.MICROREL.2005.05.012

access: closed

type: Journal Article

metadata version: 2020-12-22

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  - https://dblp.org/rec/journals/mr/LuoJZZWLNHGS06
J. F. Luo, Yuan Ji, T. X. Zhong, Y. Q. Zhang, J. Z. Wang, J. P. Liu, N. H. Niu, J. Han, X. Guo, G. D. Shen:
EBSD measurements of elastic strain fields in a GaN/sapphire structure. Microelectron. Reliab. 46(1): 178-182 (2006)

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